|
|
|
|
|
|
|
|
1. |
Record Nr. |
UNINA9910699291703321 |
|
|
Autore |
Snyder Chad R |
|
|
Titolo |
Capacitance cell measurement of the out-of-plane expansion of thin films [[electronic resource] /] / Chad R. Snyder, Frederick I. Mopsik |
|
|
|
|
|
|
|
Pubbl/distr/stampa |
|
|
[Gaithersburg, Md.] : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2001] |
|
|
|
|
|
|
|
|
|
Descrizione fisica |
|
1 online resource (x, 32 pages) : illustrations |
|
|
|
|
|
|
Collana |
|
NIST special publication ; ; no. 960-7 |
NIST recommended practice guide |
|
|
|
|
|
|
|
|
Altri autori (Persone) |
|
|
|
|
|
|
Soggetti |
|
Thin-film circuits |
Thin films - Thermal properties |
Expansion (Heat) - Measurement |
|
|
|
|
|
|
|
|
Lingua di pubblicazione |
|
|
|
|
|
|
Formato |
Materiale a stampa |
|
|
|
|
|
Livello bibliografico |
Monografia |
|
|
|
|
|
Note generali |
|
Title from title screen (viewed Apr. 19, 2011). |
"November 2001." |
"CODEN: NSPUE2." |
|
|
|
|
|
|
|
|
Nota di bibliografia |
|
Includes bibliographical references (pages 31-32). |
|
|
|
|
|