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Record Nr. |
UNINA9910694816803321 |
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Titolo |
AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films [[electronic resource] /] / C.-S. Jiang ... [and others] |
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Pubbl/distr/stampa |
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Golden, Colo. : , : National Renewable Energy Laboratory, , [2005] |
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Descrizione fisica |
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1 volume : digital, PDF file |
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Collana |
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Conference paper ; ; NREL/CP-520-37338 |
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Altri autori (Persone) |
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Soggetti |
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Thin films - Electric properties |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from title screen (viewed on Mar. 27, 2006). |
"February 2005." |
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