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Record Nr. |
UNINA9910686473103321 |
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Autore |
Nedelcu Nicoleta |
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Titolo |
Thin Films : Processes and Characterization Techniques / / by Nicoleta Nedelcu |
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Pubbl/distr/stampa |
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Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023 |
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ISBN |
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Edizione |
[1st ed. 2023.] |
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Descrizione fisica |
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1 online resource (X, 124 p. 94 illus., 79 illus. in color.) |
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Disciplina |
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Soggetti |
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Surfaces (Technology) |
Thin films |
Materials - Analysis |
Production engineering |
Materials |
Surfaces, Interfaces and Thin Film |
Materials Characterization Technique |
Process Engineering |
Materials Engineering |
Materials for Devices |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Chapter 1. Introduction -- Chapter 2. Thin layer method -- Chapter 3. Vacuum thin film deposition installation -- Chapter 4. Method for characterizing thin layer -- Chapter 5. Study of optical and chemical properties. |
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Sommario/riassunto |
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The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials’ physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, |
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graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods. |
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