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1. |
Record Nr. |
UNINA9910639984303321 |
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Autore |
Sahin Oz |
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Titolo |
Sustainable Development of Energy, Water and Environment Systems (SDEWES 2021) |
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Pubbl/distr/stampa |
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Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
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ISBN |
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Descrizione fisica |
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1 electronic resource (128 p.) |
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Soggetti |
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Research & information: general |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Sommario/riassunto |
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This book contains collections of selected articles presented at the SDEWES2021 conference and subsequently published in a special issue of Sustainability. The book provides state-of-the-art research, overviewing practices in sustainable development, energy, water and environment systems, as well as their uses and applications. Focus is given to waste management; higher biomass production; biorefineries; bio-digital interface and microbial fuel cells; energy and cost reduction in the building sector; and the economic impact of sustainability. |
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2. |
Record Nr. |
UNINA9910784136803321 |
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Autore |
Schaub Keith B. |
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Titolo |
Production testing of RF and system-on-a-chip devices for wireless communications / / Keith B. Schaub, Joe Kelly |
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Pubbl/distr/stampa |
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Norwood, Massachusetts : , : Artech House, , ©2004 |
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[Piscataqay, New Jersey] : , : IEEE Xplore, , [2004] |
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ISBN |
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Descrizione fisica |
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1 online resource (271 p.) |
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Collana |
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Artech House microwave library |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Systems on a chip - Testing |
Wireless communication systems - Equipment and supplies - Testing |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Table of Contents vi; Preface xiii; Acknowledgments xvii; CHAPTER 1; An Introduction to Production Testing 1; CHAPTER 2; RF and SOC Devices 13; CHAPTER 3; Cost of Test 33; CHAPTER 4; Production Testing of RF Devices 49; CHAPTER 5; Production Testing of SOC Devices 95; CHAPTER 6; Fundamentals of Analog and Mixed-Signal Testing 145; CHAPTER 7; Moving Beyond Production Testing 175; CHAPTER 8; Production Noise Measurements 193; Appendix A: Power and Voltage Conversions 225; Appendix B: RF Coaxial Connectors 229; List of Acronyms and Abbreviations 233; List of Numerical Prefixes 237 |
About the Authors 239Index 241 |
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Sommario/riassunto |
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