1.

Record Nr.

UNINA9910629294203321

Autore

Terakawa Shigemi

Titolo

Structure and Electronic Properties of Ultrathin In Films on Si(111) / / by Shigemi Terakawa

Pubbl/distr/stampa

Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2022

ISBN

9789811968723

9789811968716

Edizione

[1st ed. 2022.]

Descrizione fisica

1 online resource (83 pages)

Collana

Springer Theses, Recognizing Outstanding Ph.D. Research, , 2190-5061

Disciplina

621.38171

Soggetti

Surfaces (Technology)

Thin films

Surfaces (Physics)

Metals

Materials - Analysis

Chemistry, Inorganic

Density functionals

Surfaces, Interfaces and Thin Film

Surface and Interface and Thin Film

Metals and Alloys

Characterization and Analytical Technique

Inorganic Chemistry

Density Functional Theory

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Nota di bibliografia

Includes bibliographical references.

Nota di contenuto

1. Introduction -- 2. Experimental methods -- 3. Structure and electronic properties of In single-layer metal on Si(111) -- 4. Structure and electronic properties of ultrathin (In, Mg) films on Si(111) -- 5. Summary.

Sommario/riassunto

This book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called “rect” has been extensively investigated as a two-dimensional metal. Another crystalline phase called “hex” was also



suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds. The present study demonstrates interesting properties of indium itself, which is a p-block metal both with metallicity and covalency. In this book, readers also see principles of various surface analysis techniques and learn how to use them and analyze the results in the real systems. This book is useful to researchers and students interested in surface science, particularly ultrathin metal films on semiconductor surfaces.