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1. |
Record Nr. |
UNINA9910707931503321 |
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Titolo |
EPA's Technical Assistance to Brownfields (TAB) Communities Program : providing technical assistance to communites for brownfields challenges |
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Pubbl/distr/stampa |
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[Washington, D.C.] : , : United States Environmental Protection Agency, Office of Solid Waste and Emergency Response, , 2015 |
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Descrizione fisica |
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1 online resource (3 unnumbered pages) : color illustrations, color map |
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Soggetti |
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Brownfields - United States |
Hazard mitigation - United States |
Hazard mitigation |
Brownfields |
Online resources. |
United States |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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"July 2015." |
"EPA-560-F-15-194." |
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2. |
Record Nr. |
UNINA9910616385303321 |
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Autore |
Weston Astrid |
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Titolo |
Atomic and electronic properties of 2D moiré interfaces / / Astrid Weston |
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Pubbl/distr/stampa |
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Cham, Switzerland : , : Springer, , [2022] |
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©2022 |
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ISBN |
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9783031120930 |
9783031120923 |
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Descrizione fisica |
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1 online resource (148 pages) |
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Collana |
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Disciplina |
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Soggetti |
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Atomic theory |
Superlattices as materials |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di contenuto |
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Intro -- Supervisor's Foreword -- Abstract -- Acknowledgements -- Contents -- Abbreviations -- 1 Thesis Outline -- References -- 2 Introduction to 2-Dimensional Materials and Moiré Superlattices -- 2.1 2-Dimensional Materials -- 2.1.1 Graphene -- 2.1.2 Hexagonal Boron Nitride -- 2.1.3 Transition Metal Dichalcogenides -- 2.2 Moiré Superlattices -- 2.2.1 Graphene and Hexagonal Boron Nitride -- 2.2.2 Twisted Bilayer Graphene -- 2.2.3 Twisted Bilayer TMDs -- 2.3 Summary -- References -- 3 Fabrication Techniques -- 3.1 Introduction -- 3.2 Mechanical Exfoliation and Crystal Identification -- 3.3 PMMA Dry Transfer Technique -- 3.4 Fabrication of Twisted Bilayer Heterotructures -- 3.5 Contamination and Air-Sensitivity in vdWs Heterostructures -- 3.6 Fabrication of Electrical Contacts -- 3.6.1 Shadow Mask Contacts -- 3.6.2 Electron Beam Lithography Contacts -- 3.6.3 Electron Beam Metal Deposition -- 3.7 Summary -- References -- 4 Characterisation Techniques -- 4.1 Scanning Probe Microscopy -- 4.1.1 Contact Mode -- 4.1.2 Tapping Mode -- 4.1.3 Electrical SPM Modes -- 4.1.4 AFM Image Processing -- 4.2 Electron Microscopy -- 4.2.1 Principles of Electron-Matter Interaction -- 4.2.2 Scanning Electron Microscopy -- 4.2.3 SEM Image Processing -- 4.2.4 Scanning Transmission Electron Microscopy -- 4.2.5 Atomic Resolution STEM Image Processing -- 4.2.6 Electron Beam Induced Effects -- 4.3 |
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Summary -- References -- 5 Atomic Structure of Reconstructed Lattices of Twisted Bilayer TMDs -- 5.1 Sample Fabrication -- 5.2 Dark Field LAADF-STEM -- 5.3 Atomic Resolution HAADF-STEM -- 5.4 Multi-scale Modelling of Atomic Structure -- 5.5 Summary -- References -- 6 Electrical Properties of Reconstructed Lattices of Twisted Bilayer TMDs -- 6.1 Conductive-AFM Study of TMD Homobilayers -- 6.1.1 3R-Type Twisted Homobilayers -- 6.1.2 2H-Type Twisted Homobilayers. |
6.2 Kelvin Probe Force Microscopy Studies of 3R-Type Twisted Bilayer MoSSubscript 22 -- 6.3 Scanning Electron Microscopy Studies of 3R-Type Twisted Bilayer MoSSubscript 22 -- 6.4 Electron Tunnelling in 3R-Type Twisted Bilayer MoSSubscript 22 -- 6.4.1 Reference 2H Bilayer MoSSubscript 22 Tunnelling Device -- 6.4.2 3R-Type Twisted Bilayer MoSSubscript 22 Tunnelling Devices -- 6.4.3 Ferroelectric Devices with Hall Bar Geometry -- 6.5 Summary -- References -- 7 Final Conclusions and Future Outlooks. |
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