1.

Record Nr.

UNINA9910595082903321

Autore

Bąk Sylwia

Titolo

Risk Management Maturity / / Sylwia Bąk and Piotr Jedynak

Pubbl/distr/stampa

New York : , : Taylor & Francis, , 2023

ISBN

1-00-333090-8

1-000-81868-3

1-000-81866-7

Descrizione fisica

1 online resource (112 pages)

Collana

Routledge Focus on Business and Management Series

Disciplina

658.155

Soggetti

Risk management

Risk management - Auditing

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

Crises like the COVID-19 pandemic are wake-up calls for enterprises to review their current risk management models. This book suggests a more robust risk management maturity model and illustrates the application in crisis situations. The book surveys existing risk management maturity models and proposes a new model appropriate for assessing the risk management processes in enterprises during times of crisis. Its key advantages include the correlation of its attributes with crisis situations and an innovative methodological approach to model development. The authors use the model to examine 107 enterprises from the financial services, construction and IT sector, showing how it allows the user to identify risk management maturity changes in the aftermath of the COVID-19 pandemic. The book will interest entrepreneurs, managers and risk management professionals, who can use the model in their management processes, as well as enterprise stakeholders and academics. Sylwia Bąk holds a PhD in Management Sciences. She works as Researcher and Lecturer in the Management Systems Department of Jagiellonian University in Cracow, Poland. In her interests, research and publications, she focuses on issues related to risk management, crisis management, strategic management and standardized management systems.



2.

Record Nr.

UNIORUON00387078

Autore

Vitacolonna, Luciano

Titolo

Semiotica / Luciano Vitacolonna -

Pubbl/distr/stampa

Brescia, : La Scuola Editrice, 2008

ISBN

978-88-350-2199-5

Descrizione fisica

252 p. ; 24 cm.

Disciplina

401.41

Soggetti

Semiotica

Lingua di pubblicazione

Italiano

Formato

Materiale a stampa

Livello bibliografico

Monografia

3.

Record Nr.

UNINA9910557594903321

Autore

Armstrong Ronald W

Titolo

Dislocation Mechanics of Metal Plasticity and Fracturing

Pubbl/distr/stampa

Basel, Switzerland, : MDPI - Multidisciplinary Digital Publishing Institute, 2020

Descrizione fisica

1 online resource (188 p.)

Soggetti

Research and information: general

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

The modern understanding of metal plasticity and fracturing began about 100 years ago, with pioneering work; first, on crack-induced fracturing by Griffith and, second, with the invention of dislocation-enhanced crystal plasticity by Taylor, Orowan and Polanyi. The modern counterparts are fracture mechanics, as invented by Irwin, and



dislocation mechanics, as initiated in pioneering work by Cottrell. No less important was the breakthrough development of optical characterization of sectioned polycrystalline metal microstructures started by Sorby in the late 19th century and leading eventually to modern optical, x-ray and electron microscopy methods for assessments of crystal fracture surfaces, via fractography, and particularly of x-ray and electron microscopy techniques applied to quantitative characterizations of internal dislocation behaviors. A major current effort is to match computational simulations of metal deformation/fracturing behaviors with experimental measurements made over extended ranges of microstructures and over varying external conditions of stress-state, temperature and loading rate. The relation of such simulations to the development of constitutive equations for a hoped-for predictive description of material deformation/fracturing behaviors is an active topic of research. The present collection of articles provides a broad sampling of research accomplishments on the two subjects.