Intro -- Preface -- Acknowledgments -- Contents -- About the Author -- Chapter 1: The Novel Transistor Characterization Challenge -- 1.1 Introduction: Why This Book? -- 1.2 General Measurement Conditions and Terminology -- 1.2.1 Small-Signal vs Large-Signal -- 1.2.2 Frequency-Domain vs Time-Domain -- 1.2.3 Continuous-Wave vs Transient Signals -- 1.3 Overview of the Content of the Book -- Chapter 2: High-Frequency Test Equipment, Connections, and Contact with Transistors -- 2.1 Introduction -- 2.2 Signal Detection Instruments -- 2.2.1 Spectrum Analyzer -- 2.2.2 Vector Network Analyzer -- 2.2.3 Oscilloscope -- 2.3 Stimulus Instruments -- 2.4 Transmission Lines and Interconnections -- 2.5 Cables, Connectors, and Bandwidth -- 2.6 Bias Tees and Resistor Tees -- 2.7 Transistor Probing -- 2.8 Probe Pad Design -- References -- Chapter 3: Measurement of the Frequency Response of Transistors -- 3.1 Introduction -- 3.2 Methods for Low-Current Transistors -- 3.2.1 Transistor Structures -- 3.2.2 Rectification Technique -- 3.2.3 Direct Gain Measurement Technique -- 3.3 Frequency Performance Figure-of-Merit and Linear Model -- 3.3.1 AC Linear Model of Transistors -- 3.3.2 Measuring Small-Signal Current Gain with S-Parameters -- 3.3.3 Calibration -- 3.3.4 De-Embedding Procedure -- 3.3.5 Measurement Examples -- 3.3.6 Definition of the Physical Open Structure -- 3.3.7 Other Performance Figures-of-Merit -- References -- Chapter 4: Case |