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Record Nr. |
UNINA9910522952103321 |
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Autore |
Gott James A. |
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Titolo |
Defects in self-catalysed III-V nanowires / / James A. Gott |
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Pubbl/distr/stampa |
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Cham, Switzerland : , : Springer, , [2022] |
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©2022 |
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ISBN |
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9783030940621 |
9783030940614 |
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Descrizione fisica |
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1 online resource (158 pages) |
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Collana |
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Disciplina |
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Soggetti |
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Nanowires |
Semiconductors - Materials |
Semiconductors - Defects |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Intro -- Supervisor's Foreword -- Abstract -- Acknowledgements -- Contents -- Acronyms -- 1 Introduction -- 1.1 Introduction -- 1.2 Nanowires -- 1.2.1 Introduction to Nanowires -- 1.2.2 Nanowire Growth -- 1.2.3 Physical Properties -- 1.2.4 Applications -- 1.3 Defects in the III-V System -- 1.3.1 Defects in Nanowires -- 1.3.2 Mechanisms of Defect Motion -- 1.4 Nanowire Heterostructures -- 1.4.1 Dubrovskii Kinetic Growth Model -- 1.4.2 Priante/Glas Model -- 1.4.3 Muraki Model -- 1.4.4 Empirical Sigmoidal Models -- 1.4.5 Measuring Heterostructure Features Using STEM -- 1.5 Thesis Outline -- References -- 2 Methods -- 2.1 Electron Microscopy -- 2.1.1 Illumination System -- 2.1.2 Aberrations -- 2.1.3 Sample Interaction -- 2.1.4 TEM -- 2.1.5 STEM -- 2.1.6 SEM -- 2.1.7 Microscopes -- 2.2 Sample Preparation -- 2.2.1 Sample Growth -- 2.2.2 Microtome -- 2.2.3 Conventional TEM and STEM Preparation -- 2.2.4 In-Situ Microscopy -- 2.3 Simulations -- 2.4 Measuring Strain Using GPA -- 2.5 Spectroscopy -- 2.5.1 Cathodoluminescence -- 2.5.2 Energy Dispersive X-Ray Spectroscopy -- References -- 3 Defects in Nanowires -- 3.1 Introduction -- 3.2 Types of Defects in GaAs(P) Nanowires -- 3.2.1 Analysing Burgers Vectors -- 3.2.2 Σ3 {112} Defect-The Three Monolayer Defect -- 3.2.3 Defects with Non-Zero |
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