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1. |
Record Nr. |
UNINA9911019210903321 |
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Autore |
Brandon David |
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Titolo |
Microstructural Characterization of Materials |
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Pubbl/distr/stampa |
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ISBN |
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9786612342943 |
9781282342941 |
1282342940 |
9780470727126 |
0470727128 |
9780470727133 |
0470727136 |
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Edizione |
[2nd ed.] |
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Descrizione fisica |
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1 online resource (554 p.) |
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Collana |
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Quantitative software engineering series Microstructural characterization of materials |
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Altri autori (Persone) |
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KaplanWayne D |
BrandonD. G |
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Disciplina |
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Soggetti |
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Electronic books. -- local |
Materials -- Microscopy |
Microstructure |
Materials - Microscopy |
Materials Science |
Chemical & Materials Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di contenuto |
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Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals |
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2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane |
2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses |
3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation |
3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast |
4.3.2 Diffraction Contrast and Crystal Lattice Defects |
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Sommario/riassunto |
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Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.<br /> <br /> <i>Microstructural Characterization of Materials, 2nd Edition</i> is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental met |
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2. |
Record Nr. |
UNINA9910484754403321 |
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Titolo |
Web Engineering : 16th International Conference, ICWE 2016, Lugano, Switzerland, June 6-9, 2016. Proceedings / / edited by Alessandro Bozzon, Philippe Cudré-Mauroux, Cesare Pautasso |
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Pubbl/distr/stampa |
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Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
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ISBN |
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Edizione |
[1st ed. 2016.] |
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Descrizione fisica |
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1 online resource (XXVI, 626 p. 186 illus.) |
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Collana |
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Information Systems and Applications, incl. Internet/Web, and HCI, , 2946-1642 ; ; 9671 |
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Disciplina |
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Soggetti |
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Application software |
Information storage and retrieval systems |
Software engineering |
Information technology - Management |
User interfaces (Computer systems) |
Human-computer interaction |
Artificial intelligence |
Computer and Information Systems Applications |
Information Storage and Retrieval |
Software Engineering |
Computer Application in Administrative Data Processing |
User Interfaces and Human Computer Interaction |
Artificial Intelligence |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Nota di contenuto |
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Web application modelling and engineering -- Human computation and crowdsourcing -- Web applications composition and mashups -- SocialWeb applications -- SemanticWeb -- The Web of Things. |
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Sommario/riassunto |
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This book constitutes the refereed proceedings of the 16th International Conference on Web Engineering, ICWE 2016, held in Lugano, Switzerland, in June 2016. The 19 full research papers, 13 short papers, 3 vision papers, 11 demonstrations, 5 posters, 6 PhD |
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Symposium and 4 tutorials presented were carefully reviewed and selected from 120 submissions. The 16th edition of ICWE accepted contributions related to different research areas revolving around Web engineering, including: Web application modelling and engineering, Human computation and crowdsourcing, Web applications composition and mashups, SocialWeb applications, SemanticWeb, and, for the first time, also the Web of Things. |
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