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Record Nr. |
UNINA9910480728703321 |
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Autore |
Kleene Stephen Cole <1909-1994, > |
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Titolo |
Two papers on the predicate calculus / / by S.C. Kleene |
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Pubbl/distr/stampa |
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Providence : , : American Mathematical Society, , 1952 |
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ISBN |
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Descrizione fisica |
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1 online resource (72 p.) |
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Collana |
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Memoirs of the American Mathematical Society ; ; number 10 |
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Soggetti |
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Calculus |
Predicate calculus |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Cover title. |
"Second printing, with revision, 1967." |
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Nota di bibliografia |
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Bibliography: pages [67]-68. |
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Nota di contenuto |
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""PERMUTABILITY OF INFERENCES IN GENTZEN'S CALCULI LK AND LJ""; ""1. THE FORMAL SYSTEM G""; ""2. RELATIONSHIPS IN A PROOF IN G""; ""3 . INTERCHANGE OF ADJACENT LOGICAL INFERENCES""; ""4. PERMUTABILITY OF LOGICAL INFERENCES""; ""FINITE AXIOMATIZABILITY OF THEORIES IN THE PREDICATE CALCULUS USING ADDITIONAL PREDICATE SYMBOLS""; ""1. H-NUMBERS""; ""2. A PRIMITIVE RECURSIVE ENUMERATION OF H-NUMBERS""; ""3 . THE SYSTEM S[sub(1)]""; ""4. THE SYSTEMS S[sub(2)], S[sub(3)]""; ""5. THE SYSTEMS S[sub(0)], S""; ""6. A NON-CONSTRUCTIVE PROOF OF CONSISTENCY FOR THE CLASSICAL CASE"" |
""7. EFFECT OF THE EQUALITY AXIOMS WITH A NEW EQUALITY SYMBOL""""8. EFFECT OF THE AXIOMS OF S[sub(1)]""; ""9. EFFECT OF THE AXIOM OF S[sub(2)]""; ""10. EFFECT OF THE AXIOMS OF S[sub(3)]""; ""11. CONCLUSION OF THE CONSISTENCY PROOF""; ""BIBLIOGRAPHY"" |
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2. |
Record Nr. |
UNINA9910146740903321 |
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Titolo |
Neutrons and synchrotron radiation in engineering materials science [[electronic resource] ] : from fundamentals to superior materials characterization / / edited by Walter Reimers ... [et al.] |
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Pubbl/distr/stampa |
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Weinheim, : Wiley-VCH, 2007 |
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ISBN |
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1-282-37221-1 |
9786612372216 |
3-527-62193-8 |
3-527-62192-X |
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Descrizione fisica |
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1 online resource (462 p.) |
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Altri autori (Persone) |
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ReimersW <1943-> (Walter) |
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Disciplina |
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Soggetti |
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Synchrotron radiation |
Materials - Testing |
Materials - Analysis |
Materials - Effect of radiation on |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Neutrons and Synchrotron Radiation in Engineering Materials Science; Contents; Preface; List of Contributors; Part I General; 1 Microstructure and Properties of Engineering Materials; 2 Internal Stresses in Engineering Materials; 3 Texture and Texture Analysis in Engineering Materials; 4 Physical Properties of Photons and Neutrons; 5 Radiation Sources; Part II Methods; 6 Introduction to Diffraction Methods for Internal Stress Analyses; 7 Stress Analysis by Angle-Dispersive Neutron Diffraction; 8 Stress Analysis by Energy-Dispersive Neutron Diffraction |
9 Residual Stress Analysis by Monochromatic High-Energy X-rays10 Residual Stress Analysis by White High Energy X-Rays; 11 Diffraction Imaging for Microstructure Analysis; 12 Basics of Small-Angle Scattering Methods; 13 Small-Angle Neutron Scattering; 14 Decomposition Kinetics in Copper-Cobalt Alloy Systems: Applications of Small-Angle X-ray Scattering; 15 B3 Imaging; 16 Neutron and Synchrotron-Radiation-Based Imaging for Applications in Materials |
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Science - From Macro- to Nanotomography; 17 μ-Tomography of Engineering Materials; 18 Diffraction Enhanced Imaging |
Part III New and Emerging Methods19 3D X-ray Diffraction Microscope; 20 3D Micron-Resolution Laue Diffraction; 21 Quantitative Analysis of Three-Dimensional Plastic Strain Fields Using Markers and X-ray Absorption Tomography; 22 Combined Diffraction and Tomography; Part IV Industrial Applications; 23 Diffraction-Based Residual Stress Analysis Applied to Problems in the Aircraft Industry; 24 Optimization of Residual Stresses in Crankshafts; Index |
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Sommario/riassunto |
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Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments. |
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