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1. |
Record Nr. |
UNINA9910464078703321 |
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Autore |
Strandberg Kenneth M. |
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Titolo |
Essentials of law and ethics for pharmacy technicians / / Kenneth M. Strandberg |
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Pubbl/distr/stampa |
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Boca Raton, Fla. : , : CRC Press, , 2012 |
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ISBN |
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0-429-24843-1 |
1-4398-9610-0 |
1-4398-5315-0 |
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Edizione |
[Third edition.] |
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Descrizione fisica |
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1 online resource (184 p.) |
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Collana |
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Pharmacy Education Series ; ; 26 |
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Disciplina |
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Soggetti |
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Pharmacy technicians - Professional ethics - United States |
Pharmacists - Legal status, laws, etc - United States |
Pharmacy - Law and legislation - United States |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di contenuto |
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Front Cover; Contents; Preface; Acknowledgments; Authors; The legal system in the United States; Chapter 2: History and development of current law; Chapter 3: Food, Drug, and Cosmetic Act of 1938; Chapter 4: Federal Controlled Substance Act of 1970; Chapter 5: Other pertinent federal legislation; Chapter 6: Ethics theory and application; appendix one: Addresses and websites of board of pharmacy executives; appendix two: Addresses and websites of pertinent pharmacy organizations; appendix three: List of accredited pharmacy technician programs; appendix four: Sample DEA forms |
appendix five: Legal standing of pharmacy techniciansappendix six: Legal status of fax prescriptions; appendix seven: Legal status of electronic transmission of prescriptions; appendix eight: Who has prescribing authority; Back Cover |
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Sommario/riassunto |
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Preface While many excellent textbooks deal with pharmacy laws, regulations, and ethics, virtually all of those currently marketed are aimed at the university-level pharmacy student. During my years as a faculty member and as a department chair, the lack of textbooks intended for pharmacy technicians became more and more noticeable, |
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especially after visiting with pharmacy technician faculty and our colleagues at Pharmacy Technician Educator's Council (PTEC) meetings. The standard practice has been to incorporate law and ethics material into other classes, using parts of these university-level textbooks and articles and adding extra lecture time and materials. Very few programs have a stand-alone law and ethics course or even a segment of such a course, which can perhaps be explained by the fact that so few texts have been aimed at this need. Instructors have been forced to make do with materials and resources meant for an entirely different group of students-- |
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2. |
Record Nr. |
UNINA9910778308503321 |
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Autore |
Boas U |
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Titolo |
Dendrimers in medicine and biotechnology [[electronic resource] ] : new molecular tools / / U. Boas, J.B. Christensen, P.M.H. Heegaard |
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Pubbl/distr/stampa |
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Cambridge [England], : RSC Pub., 2006 |
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ISBN |
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Descrizione fisica |
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1 online resource (191 p.) |
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Altri autori (Persone) |
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ChristensenJ. B (Jørn Bolstad) |
HeegaardP. M. H |
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Disciplina |
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Soggetti |
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Dendrimers in medicine |
Molecular structure |
Biotechnology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Dendrimers in Medicine_publicity; i_iv; v_vi preface dendrimers; vii_x contents dendrimers; 001_027 ch 1 dendrimers; 028_061; 062_089; 090_129; 130_151; 152_172; 173_180 |
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Sommario/riassunto |
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Dendrimers are a new class of macromolecule increasingly used in the fields of synthetic organic chemistry, biology, medicine and biotechnology. Dendrimers in Medicine and Biotechnology: New Molecular Tools looks at this exciting and rapidly growing area of science. Using an interdisciplinary approach with particular emphasis |
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on biological applications, the book discusses the relationship between the dendrimer molecular motif and its biological properties.A general introduction to the subject of dendrimers, including definitions of terms and symbols, is provided. Subsequent sections discuss to |
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3. |
Record Nr. |
UNINA9910954466603321 |
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Autore |
Goldstein Joseph <1939-2015, > |
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Titolo |
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists / / by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin |
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Pubbl/distr/stampa |
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New York, NY : , : Springer US : , : Imprint : Springer, , 1992 |
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ISBN |
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Edizione |
[2nd ed. 1992.] |
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Descrizione fisica |
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1 online resource (840 pages) |
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Disciplina |
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Soggetti |
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Earth sciences |
Developmental biology |
Materials - Analysis |
Earth Sciences |
Developmental Biology and Stem Cells |
Characterization and Analytical Technique |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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Nota di bibliografia |
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Includes bibliographical references and index |
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Nota di contenuto |
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1. Introduction -- 1.1. Evolution of the Scanning Electron Microscope -- 1.2. Evolution of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron Optics -- 2.1. How the SEM Works -- 2.2. Electron Guns -- 2.3. Electron Lenses -- 2.4. Electron Probe Diameter versus Electron Probe Current -- 2.5. Summary of SEM Microscopy Modes -- 3. Electron-Specimen Interactions -- 3.1. Introduction -- 3.2. Electron Scattering -- 3.3. Interaction Volume -- 3.4. Signals from Elastic Scattering -- 3.5. Signals from Inelastic Scattering -- 3.6. Summary -- 4. Image Formation and Interpretation -- 4.1. Introduction -- 4.2. The Basic SEM Imaging Process -- 4.3. Detectors -- 4.4. Image |
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Contrast at Low Magnification (100,000x) -- 4.7. Image Processing for the Display of Contrast Information -- 4.8. Defects of the SEM Imaging Process -- 4.9. Special Topics in SEM Imaging -- 4.10. Developing a Comprehensive Imaging Strategy -- 5. X-Ray Spectral Measurement: WDS and EDS -- 5.1. Introduction -- 5.2. Wavelength-Dispersive Spectrometer -- 5.3. Energy-Dispersive X-Ray Spectrometer -- 5.4. Comparison of WDS and EDS -- Appendix: Initial Detector Setup and Testing -- 6. Qualitative X-Ray Analysis -- 6.1. Introduction -- 6.2. EDS Qualitative Analysis -- 6.3. WDS Qualitative Analysis -- 6.4. Automatic Qualitative EDS Analysis -- 7. X-Ray Peak and Background Measurements -- 7.1. General Considerations for X-Ray Data Handling -- 7.2. Background Correction -- 7.3. Peak Overlap Correction -- 8. Quantitative X-Ray Analysis: The Basics -- 8.1. Introduction -- 8.2. Advantages of Quantitative X-Ray Microanalysis in the SEM/EPMA -- 8.3. Quantitative Analysis Procedures -- 8.4. The Approach to X-Ray Quantitation: The Need for Matrix Corrections -- 8.5. The Physical Origin of Matrix Effects -- 8.6. X-Ray Production -- 8.7. ZAF Factors in Microanalysis -- 8.8. Types of Matrix Correction Schemes -- 8.9. Caveats -- 9. Quantitative X-Ray Analysis: Theory and Practice -- 9.1. Introduction -- 9.2. ZAF Technique -- 9.3. ø; (?z) Technique -- 9.8. Special Sample Analysis -- 9.9. Precision and Sensitivity in X-Ray Analysis -- 9.10. Light-Element Analysis -- Appendix 9.1. Equations for the ?, ?, ?, and ø(0) Terms of the Packwood-Brown ø (?z) Equation -- Appendix 9.2. Solutions for the Atomic Number and Absorption Corrections -- 10. Compositional Imaging -- 10.1. Introduction -- 10.2. Analog X-Ray Area Scanning (Dot Mapping) -- 10.3. Digital Compositional Mapping. -- 11. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2. Ceramics and Geological Specimens -- 11.3. Electronic Devices and Packages -- 11.4. Semiconductors -- 11.5. Sands, Soils, and Clays -- 11.6. Particles and Fibers -- 12. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials -- 12.1. Introduction -- 12.2. Compromising the Electron-Beam Instrument -- 12.3. Compromising the Sample -- 12.4. Correlative Microscopy -- 12.5. Techniques for Structural Studies -- 12.6. Specimen Preparation for Localization of Metabolic Activity and Chemical Specificity -- 12.7 Preparative Procedures for Organic Samples Such as Polymers, Plastics, and Paints -- 12.8. Low-Temperature Specimen Preparation for Structural and Analytical Studies -- 12.9. Damage, Artifact, and Interpretation -- 12.10. Specific Preparative Procedures: A Bibliography -- 13. Coating and Conductivity Techniques for SEM and Microanalysis -- 13.1. Introduction -- 13.2. Specimen Characteristics -- 13.3. Untreated Specimens -- 13.4.Bulk Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6. Thin-Film Methods -- 13.7. Thermal Evaporation -- 13.8. Sputter Coating -- 13.9. Specialized Coating Methods -- 13.10. Determination of Coating Thickness -- 13.11. Artifacts Related to Coating and Bulk-Conductivity Procedures -- 13.12. Conclusions -- 14 Data Base -- Table 14.1. Atomic Number, Atomic Weight, and Density of Elements -- Table 14.2. Common Oxides of the Elements -- Table 14.3. Mass Absorption Coefficients for ? Lines -- Table 14.4. Mass Absorption Coefficients for ? Lines -- Table 14.5. Mass Absorption Coefficients for ? Lines -- Table 14.6. K Series X-Ray Wavelengths and Energies -- Table 14.7. L Series X-Ray Wavelengths and Energies ! -- Table 14.8. M Series X-Ray Wavelengths and Energies -- Table 14.9. J and Fluorescent Yield (?) by Atomic Number -- Table 14.10. Important Properties of Selected Coating Elements -- References. |
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Sommario/riassunto |
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In the last decade, since the publication of the first edition of Scanning |
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Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities. |
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