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Auger analysis of worn surfaces after "unlubricated wear" -- 4.4 In situ systems -- 4.5 Conclusions -- References -- |
[5.] Abrasive wear -- 5.1 Abrasive asperities and grooves -- 5.2 Yield criterion of an abrasive asperity -- Abrasive wear mode diagram -- 5.3 Degree of wear at one abrasive groove -- 5.4 Macroscopic wear in multiple abrasive sliding contacts -- References -- |
[6.] Boundary lubrication -- 6.1 Introduction -- 6.2 Mechanical effects in lubrication -- 6.3 Adequacy of hydrodynamic fluid films -- 6.4 Chemical effects in liquid lubrication, boundary lubrication -- 6.5 Wear and failure -- 6.6 Research in boundary lubrication -- 6.7 Laboratory research -- 6.8 Composition of films -- 6.9 Further mechanical effects of the boundary lubricant layer -- 6.10 Surface analysis of boundary lubricated metals -- 6.11 Ellipsometry and its use in measuring film thickness -- References -- |
[7.] Magnetic recording surfaces -- 7.1 Introduction -- 7.2 Magnetic storage systems -- 7.3 Wear mechanisms -- Head-(particulate) tape interface -- Head-(particulate) rigid disk interface -- Head-(thin-film) rigid disk interface -- 7.4 Lubrication mechanisms -- Measurement of localized lubricant film thickness -- Lubricant-disk surface interactions -- Lubricant degradation -- References -- |
[8.] Surface analysis of precision ball bearings -- 8.1 Introduction -- 8.2 Disassembly -- Examination, optical microscopy, and photography -- Gas analysis by mass spectrometry -- Lubricant analysis and removal -- 8.3 Microexamination -- Scanning electron microscopy -- Profilometry -- 8.4 Surface analysis -- Auger electron spectroscopy -- Photoelectron spectroscopy -- SIMS -- Vibrational spectroscopy -- 8.5 Future directions -- Acknowledgments -- References -- |
[9.] Atomic force microscope nanofriction -- 9.1 Introduction -- 9.2 Description -- 9.3 Friction measurements -- 9.4 Uses -- 9.5 Kelvin probe application -- References -- |
Appendices: technique summaries -- Light microscopy -- Scanning electron microscopy (SEM) -- In situ wear device for the scanning electron microscope -- Scanning tunneling microscopy and scanning force microscopy (STM and SFM) -- Transmission electron microscopy (TEM) -- Energy-dispersive x-ray spectroscopy (EDS) -- Scanning transmission electron microscopy (STEM) -- Electron probe x-ray microanalysis (EPMA) -- X-ray diffraction (XRD) -- Low-energy electron diffraction (LEED) -- X-ray photoelectron spectroscopy (XPS) -- Auger electron spectroscopy (AES) -- Fourier transform infrared spectroscopy (FTIR) -- Raman spectroscopy -- Rutherford backscattering spectrometry (RBS) -- Static secondary ion mass spectrometry (static SIMS) -- Surface roughness: measurement, formation by sputtering, impact on depth profiling -- Index. |