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1. |
Record Nr. |
UNINA9910453160903321 |
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Titolo |
Terrestrial neutron-induced soft errors in advanced memory devices [[electronic resource] /] / Takashi Nakamura ... [et al.] |
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Pubbl/distr/stampa |
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Hackensack, NJ, : World Scientific, c2008 |
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ISBN |
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1-281-93005-9 |
9786611930059 |
981-277-882-9 |
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Descrizione fisica |
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1 online resource (364 p.) |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Semiconductor storage devices |
Neutron irradiation |
Radiation dosimetry |
Nuclear physics |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references (p. 291-315) and index. |
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Nota di contenuto |
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CONTENTS; Preface; About the Authors; Chapter 1 Introduction; 1.1 Background; 1.2 General Description of the SEE Mechanism; 1.3 Overview of Quantitative Evaluation Methods; Chapter 2 Terrestrial Neutron Spectrometry and Dosimetry; 2.1 Introduction; 2.2 Neutron Detection Method; 2.2.1 Multi-moderator spectrometer (Bonner Ball, Bonner sphere); 2.2.2 Organic liquid scintillation spectrometer; 2.2.3 Dose equivalent counter (rem counter); 2.2.4 Phoswich-type detector; 2.3 Experimental Procedure; 2.3.1 Sequential neutron measurements on the ground at sea level |
2.3.2 Neutron measurements aboard an airplane and at mountain level2.3.3 Data analysis; 2.4 Results and Discussions; 2.4.1 Atmospheric pressure effect; 2.4.2 Neutron energy spectra; 2.4.3 Time-sequential results of neutron ambient dose equivalent rates; 2.4.4 Average values of neutron flux and ambient dose equivalent; 2.4.5 Variation with latitude, altitude and solar activity; 2.4.6 Calculation of the cosmic-ray neutron spectrum; 2.5 Concluding Remarks; Chapter 3 Irradiation Testing in the Terrestrial Field; 3.1 What |
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Does Real-Time SER Mean?; 3.2 Statistics and FIT Estimation Methodology |
3.2.1 Confidence level3.2.2 SER FIT rate calculation (example); 3.3 Overview of the Real-Time SER Evaluation System for Memory Devices; 3.3.1 Overview of the memory devices; 3.3.2 General description of a Real-Time SER evaluation system; 3.4 Environmental Conditions of Real-Time SER Testing; 3.4.1 Spatial and temporal variation of the terrestrial neutron energy spectrum and dose; 3.4.2 Geomagnetic latitude, longitude and altitude of Real-Time SER tests; 3.4.3 Day-, night-time and monthly variation of neutron dose at ground level; 3.4.4 Monitoring of neutron dose during Real-Time SER testing |
3.5 Real-Time SER Pre-test Preparations3.5.1 Sample selection; 3.5.2 DUT preparation and orientation; 3.5.3 Test program verification; 3.5.4 Effective neutron flux at the test location; 3.5.5 Test locations of Real-Time SER testing; 3.6 The Impact of Noise on Real-Time SER and Neutron Dose Rate: An Example of Field-testing; 3.6.1 Concrete attenuation length; 3.6.2 Verification of the altitude dependence at field-testing; 3.6.3 Correlation between neutron dose rate and neutron-induced soft error in the field; 3.6.4 Neutron dose equivalent rate in the environment |
3.6.5 Comparison of MCU ratio between RTSER and neutron-induced SER3.6.6 Analysis of MCU and anomalous noise results from SER testing at the USA test sites; 3.6.7 Relation between the influence of solar wind and the change in neutron dose rate; 3.6.8 Verification of proper operation of the rem counter after the SER test; 3.7 Summary; Chapter 4 Neutron Irradiation Test Facilities; 4.1 Overview of Neutron Sources used in Neutron Irradiation Test Facilities; 4.2 Monoenergetic Neutron Source below 20 MeV; 4.2.1 14 MeV neutron source; 4.2.2 Variable energy sources |
Fast Neutron Laboratory (FNL), Tohoku University |
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Sommario/riassunto |
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Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features. <i>Sample Chapter(s)</i><br>Chapter 1: Introduction (238 KB)<br>Table A.30 mentioned in Ap |
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2. |
Record Nr. |
UNINA9910465307603321 |
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Autore |
Feinberg Richard E. |
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Titolo |
Open for business : building the new Cuban economy / / Richard E. Feinberg |
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Pubbl/distr/stampa |
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Washington, District of Columbia : , : Brookings Institution Press, , 2016 |
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©2016 |
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ISBN |
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Descrizione fisica |
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1 online resource (284 p.) |
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Disciplina |
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Soggetti |
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Electronic books. |
Cuba Foreign economic relations |
Cuba Commerce |
Cuba Economic policy |
Cuba Economic conditions 1990- |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Cuba opens a door to the world: the United States engages -- The old Cuban economy and Raul Castro's efforts to fix it -- Dancing with many partners: good balance, poor execution -- Opening to foreign investment: new portfolio opportunities -- Joint ventures in Cuba: seven case studies -- Emerging entrepreneurs and middle classes -- Millennial voices: ambitions and visions -- Scenarios: dreaming in Cuban. |
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Sommario/riassunto |
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An expert guide to Cuba's economic opening to the outside world. Ninety miles across the Straits of Florida, an exciting new revolution is afoot. This time, instead of guerillas marching down the streets of Havana, it is a global economy that will upend Cuba. Now opening to the world, what new forms is this nascent economy likely to take? Open for Business: The New Cuban Economy, Richard E. Feinberg's new book, examines the Cuban economy as it makes its early steps into developing a more dynamic market economy. He examines key issues like the role foreign investors will play, how Cubans will f |
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