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Record Nr. |
UNINA9910452298303321 |
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Autore |
Fong C. Y (Ching-yao) |
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Titolo |
Half-metallic materials and their properties [[electronic resource] /] / C.Y. Fong, J.E. Pask & L.H. Yang |
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Pubbl/distr/stampa |
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London, UK, : Imperial College Press |
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Singapore, : Dist. by World Scientific, 2013 |
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ISBN |
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1-299-46215-4 |
1-908977-13-2 |
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Descrizione fisica |
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1 online resource (304 p.) |
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Collana |
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Materials for engineering ; ; v. 2 |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Metallic composites |
Metals |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Acknowledgments; Preface; Contents; 1. Introduction; 1.1 Background; 1.2 Classes of Half-metals; 1.3 Half-metallic Devices; 2. Methods of Studying Half-metals; 2.1 Introduction; 2.2 Molecular BeamEpitaxy (MBE); 2.2.1. Schematic setup; 2.2.2. Issues concerning growth; 2.2.2.1. Substrate for Heusler alloys; 2.2.2.2. Substrate for HMs with ZB structure; 2.2.2.3. Temperature; 2.3 Characterization of Samples; 2.3.1. Reflection high-energy electron diffraction (RHEED); 2.3.1.1. Basic information; 2.3.1.2. What is measured; 2.3.2. X-ray reflectometry (XRR); 2.3.2.1. Basic information |
2.3.2.2. Schematic setup2.3.2.3. What is measured; 2.3.3. Scanning tunneling microscopy (STM); 2.3.3.1. Basic information; 2.3.3.2. What is measured; 2.3.4. Auger electron spectroscopy (AES); 2.3.4.1. Basic processes; 2.3.4.2. Simplified experimental setup; 2.3.4.3. What is measured; 2.3.4.4. Remarks; 2.4 Methods of Determining Physical Properties; 2.4.1. Magnetic properties; 2.4.1.1. SQUID-based magnetometer; 2.4.1.2. Magneto-optical Kerr effect (MOKE); 2.4.1.3. X-ray magnetic circular dichroism (XMCD); 2.4.2. Transport properties; |
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