I consumi energetici delle imprese industriali : anno 2001 / Istat

• Record Nr.: UNISA990005520420203316
• Autore: Istituto centrale di statistica
• Pubbl/distr/stampa: Roma : Istat, 2004
• Descrizione fisica: 33 p. ; 30 cm + 1 Cd-Rom
• Collana: Informazioni ; 29
• Disciplina: 333.79130945
• Collocazione: 300 333.79130945 ist
• Lingua di pubblicazione: Italiano
• Formato: Materiale a stampa
• Livello bibliografico: Monografia

Electron dynamics by inelastic X-ray scattering [[electronic resource] /] / Winfried Schülke

• Record Nr.: UNINA9910451906303321
• Autore: Schülke Winfried
• Pubbl/distr/stampa: Oxford ; ; New York, : Oxford University Press, 2007
• ISBN: 1-281-16006-7; 9786611160067; 0-19-152328-3; 1-4356-2072-0
• Descrizione fisica: 1 online resource (606 p.)
• Collana: Oxford series on synchrotron radiation ; ; 7
• Disciplina: 539.7/58
• Soggetti: X-rays - Scattering; Electrons - Inelastic scattering; Electronic books.
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Contents; List of important symbols; 1 Introductory survey; 2 Characteristic valence electron excitations; 3 Core-electron excitation (X-ray Raman scattering (XRS)); 4 The Compton scattering regime; 5 Resonant inelastic X-ray scattering (RIXS); 6 Theoretical foundation; Index
• Sommario/riassunto: The book offers the first comprehensive review of experimental methods, theory, and successful applications of synchrotron radiation based inelastic X-ray scattering (IXS) spectroscopy, which enables the investigation of electron dynamics in condensed matter (correlated motion and excitation). - ;Knowledge of the dynamics of many-electron systems is of fundamental importance to all disciplines of condensed matter physics. A very effective access to electron dynamics is offered by inelastic X-ray scattering (IXS) spectroscopy. The double differential scattering cross section for IXS is directly