1.

Record Nr.

UNINA9910450104603321

Autore

Sarid Dror

Titolo

Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid

Pubbl/distr/stampa

New York, New York ; ; Oxford, England : , : Oxford University Press, , 1994

ISBN

1-280-44178-X

0-19-802281-6

9786610441785

0-19-534469-3

1-60256-628-3

Edizione

[Rev. ed.]

Descrizione fisica

1 online resource (xiii,263p. ) : ill

Collana

Oxford series in optical and imaging sciences

Disciplina

502.82

Soggetti

Scanning force microscopy

Surfaces (Physics)

Electronic books.

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Previous ed.: 1991.

Nota di bibliografia

Includes bibliographical references (p. 233-259) and index.

Nota di contenuto

Intro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1.



Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary.

Chapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index.

Sommario/riassunto

Includes information about the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. This book also includes research in SFM and a bibliography. It will be useful for academic and industrial researchers using SFM.



2.

Record Nr.

UNISA996280148303316

Titolo

Computational Intelligence for Human-like Intelligence (CIHLI), 2014 IEEE Symposium on

Pubbl/distr/stampa

IEEE

ISBN

1-4799-4506-4

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

3.

Record Nr.

UNINA9910134724203321

Titolo

Japanese journal of applied physics . Part 2 Letters

Pubbl/distr/stampa

Tokyo, Japan, : Publication Board, Japanese Journal of Applied Physics, ©1982-2007

ISSN

1347-4065

Descrizione fisica

1 online resource

Disciplina

620/.005

Soggetti

Physics

Technology

Ingénierie

Physique

Periodicals.

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Periodico

Note generali

Refereed/Peer-reviewed

"Published monthly with the cooperation of the Physical Society of Japan and the Japan Society of Applied Physics."