Multivariate statistical process control : process monitoring methods and applications / / Zhiqiang Ge, Zhihuan Song

• Record Nr.: UNINA9910437928003321
• Autore: Ge Zhiqiang
• Pubbl/distr/stampa: London ; ; New York, : Springer, c2013
• ISBN: 9781283910620; 1283910624; 9781447145134; 1447145135
• Edizione: [1st ed. 2013.]
• Descrizione fisica: 1 online resource (203 p.)
• Collana: Advances in industrial control, , 1430-9491
• Altri autori (Persone): SongZhihuan
• Disciplina: 658.5/62; 658.562; 658.56201519535
• Soggetti: Process control; Multivariate analysis
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Introduction -- An Overview of Conventional MSPC Methods -- Non-Gaussian Process Monitoring -- Fault Reconstruction and Identification -- Nonlinear Process Monitoring: Part I -- Nonlinear Process Monitoring: Part 2 -- Time-varying Process Monitoring -- Multimode Process Monitoring: Part 1 -- Multimode Process Monitoring: Part 2 -- Dynamic Process Monitoring -- Probabilistic Process Monitoring -- Plant-wide Process Monitoring: Multiblock Method -- Reference -- Index.
• Sommario/riassunto: Given their key position in the process control industry, process monitoring techniques have been extensively investigated by industrial practitioners and academic control researchers. Multivariate statistical process control (MSPC) is one of the most popular data-based methods for process monitoring and is widely used in various industrial areas. Effective routines for process monitoring can help operators run industrial processes efficiently at the same time as maintaining high product quality. Multivariate Statistical Process Control reviews the developments and improvements that have been made to MSPC over ; the last decade, and goes on to propose a series of new MSPC-based approaches for complex process monitoring. These new methods are demonstrated in several case studies from the chemical, biological, and semiconductor industrial areas. Control and process engineers, and academic researchers in the process monitoring, process control and fault detection and isolation (FDI) disciplines will be interested in this book. It can also be used to provide supplementary material and industrial insight for graduate and advanced undergraduate students, and graduate engineers.