1.

Record Nr.

UNINA9910437909903321

Autore

Clara Martin

Titolo

High-Performance D/A-Converters [[electronic resource] ] : Application to Digital Transceivers / / by Martin Clara

Pubbl/distr/stampa

Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013

ISBN

1-283-94626-2

3-642-31229-2

Edizione

[1st ed. 2013.]

Descrizione fisica

1 online resource (296 p.)

Collana

Springer Series in Advanced Microelectronics, , 1437-0387 ; ; 36

Disciplina

621.38159

Soggetti

Signal processing

Image processing

Speech processing systems

Electronics

Microelectronics

Semiconductors

Electronic circuits

Signal, Image and Speech Processing

Electronics and Microelectronics, Instrumentation

Electronic Circuits and Devices

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

Performance Figures of D/A-Converters -- Static Linearity -- Dynamic Linearity -- Noise-shaped D/A-Converters -- Advanced Current Calibration.

Sommario/riassunto

This book deals with modeling and implementation of high performance, current-steering D/A-converters for digital transceivers in nanometer CMOS technology. In the first part, the fundamental performance limitations of current-steering DACs are discussed. Based on simplified models, closed-form expressions for a number of basic non-ideal effects are derived and tested.  With the knowledge of basic performance limits, the converter and system architecture can be optimized in an early design phase, trading off circuit complexity,



silicon area and power dissipation for static and dynamic performance. The second part describes four different current-steering DAC designs in standard 130 nm CMOS. The converters have a resolution in the range of 12-14 bits for an analog bandwidth between 2.2 MHz and 50 MHz and sampling rates from 100 MHz to 350 MHz. Dynamic-Element-Matching (DEM) and advanced dynamic current calibration techniques are employed to minimize the required silicon area.