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Record Nr. |
UNINA9910373886003321 |
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Autore |
Lan Rui |
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Titolo |
Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory / / by Rui Lan |
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Pubbl/distr/stampa |
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Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 |
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ISBN |
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Edizione |
[1st ed. 2020.] |
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Descrizione fisica |
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1 online resource (XI, 139 p. 120 illus., 64 illus. in color.) |
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Disciplina |
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Soggetti |
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Materials science |
Optical materials |
Electronic materials |
Semiconductors |
Engineering—Materials |
Electronic circuits |
Phase transitions (Statistical physics) |
Characterization and Evaluation of Materials |
Optical and Electronic Materials |
Materials Engineering |
Electronic Circuits and Devices |
Phase Transitions and Multiphase Systems |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di contenuto |
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Introduction -- Establishment of the hot strip method for thermal conductivity meausurements of Ge-Sb-Te alloys -- Thermal conductivities of Ge-Sb-Te alloys -- Electrical resistivities of Ge-Sb-Te alloys -- Thermal conduction mechanisms and prediction equations of thermal conductivity for Ge-Sb-Te alloys -- Densities of Ge-Sb-Te alloys -- Summary and conclusions. . |
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Sommario/riassunto |
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This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change |
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