1.

Record Nr.

UNINA9910349501403321

Autore

Srivastava Ajay Kumar

Titolo

Si Detectors and Characterization for HEP and Photon Science Experiment : How to Design Detectors by TCAD Simulation / / by Ajay Kumar Srivastava

Pubbl/distr/stampa

Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019

ISBN

3-030-19531-7

Edizione

[1st ed. 2019.]

Descrizione fisica

1 online resource (XVII, 183 p. 106 illus., 77 illus. in color.)

Disciplina

539.73

539.722

Soggetti

Particle acceleration

Computer-aided engineering

Physical measurements

Measurement

Solid state physics

Materials science

Nuclear physics

Heavy ions

Particle Acceleration and Detection, Beam Physics

Computer-Aided Engineering (CAD, CAE) and Design

Measurement Science and Instrumentation

Solid State Physics

Characterization and Evaluation of Materials

Nuclear Physics, Heavy Ions, Hadrons

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Nota di contenuto

Development OF Si DETECTORS FOR THE CMS LHC Experiments -- Physics and Technology of Si Detectors.-Performance of MCz Si Material for p+nn+ and n+pp+ Si Sensor Design: Status and Development for HL-LHC: Status and Development for HL-LHC -- Development OF RADIATION HARD PIXEL DETECTORS FOR THE EUROPEAN XFEL -- T-CAD Simulation for the designing of detectors --



Development of Radiation Hard p+n Si Pixel Sensors for the European XFEL -- Analysis & Optimal Design of Radiation Hard p+n Si Pixel Detector for the Next generation Photon Science Experiments -- CapacitanceS in p+n silicon pixel sensors using 3-D TCAD simulation approach.-CHARACTERIZATION OF SI DETECTORS -- Analysis and TCAD Simulation for C/V, and G/V Electrical Characteristics of Gated Controlled Diodes for the AGIPD of the EuXFEL -- Si Detector for HEP and Photon Science Experiments: How to Design Detectors by TCAD Simulation -- Appendices.

Sommario/riassunto

This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation. Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors. The book is intended for researchers and master’s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL. .