Rietveld Refinement in the Characterization of Crystalline Materials
Pubbl/distr/stampa
MDPI - Multidisciplinary Digital Publishing Institute, 2019
ISBN
3-03897-528-1
Descrizione fisica
1 electronic resource (88 p.)
Lingua di pubblicazione
Inglese
Formato
Materiale a stampa
Livello bibliografico
Monografia
Sommario/riassunto
This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.