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1. |
Record Nr. |
UNINA9910338545003321 |
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Titolo |
Jugendstil : Kunst um 1900 / bearbeitet von Carl Benno Heller |
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Pubbl/distr/stampa |
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Darmstadt : Eduard Roether, 1982 |
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ISBN |
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Descrizione fisica |
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Collana |
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Kataloge des Hessischen Landesmuseums Darmstadt ; 12 |
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Disciplina |
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Locazione |
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Collocazione |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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2. |
Record Nr. |
UNINA9910707300603321 |
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Titolo |
Proceedings of the 2nd International Conference on Volcanic Ash and Aviation Safety : June 21-24, 2004, Hilton Alexandria Mark Center Hotel, Alexandria, Virginia (USA) / / Office of the Federal Coordinator for Meteorological Services and Supporting Research |
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Pubbl/distr/stampa |
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Silver Spring, Maryland : , : U.S. Department of Commerce, National Oceanic and Atmospheric Administration, Office of the Federal Coordinator for Meteorological Services and Supporting Research, , 2004 |
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Descrizione fisica |
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1 online resource (various pagings) : illustrations, maps |
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Soggetti |
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Volcanic hazard analysis |
Volcanic ash, tuff, etc |
Aeronautics - Safety measures |
Air - Pollution |
Volcanic activity prediction |
Conference papers and proceedings. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from title screen (viewed on Apr. 12, 2016). |
"Washington, DC, November 2004." |
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Nota di bibliografia |
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Includes bibliographical references. |
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3. |
Record Nr. |
UNINA9910872899403321 |
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Titolo |
1998 Conference on High-Temperature Electronic Materials, Devices and Sensors Proceedings |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 1998 |
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Descrizione fisica |
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1 online resource (500 pages) |
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Disciplina |
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Soggetti |
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Detectors |
Electronic apparatus and appliances - Thermal properties |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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Sommario/riassunto |
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This paper presents the high temperature behaviour of RF LDMOSFETs used in wireless applications. Self heating is an important issue in RF power transistors. Self heating could cause thermal runaway in the device if the package has not been optimally designed to dissipate the heat generated in the device. Temperature rise due to self heating is of greater concern in SOI devices because of the presence of the buried oxide layer which has lesser thermal conductivity than bulk Si. In this work, 2D finite element electrothermal simulators were used to investigate the extent of self heating. Thermal models were solved in the MIXEDMODE circuit/device simulator with the package parasitics included, to study the temperature rise in the device due to self heating. |
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