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Record Nr. |
UNINA9910300389603321 |
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Autore |
Haschke Michael |
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Titolo |
Laboratory Micro-X-Ray Fluorescence Spectroscopy : Instrumentation and Applications / / by Michael Haschke |
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Pubbl/distr/stampa |
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Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 |
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ISBN |
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Edizione |
[1st ed. 2014.] |
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Descrizione fisica |
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1 online resource (367 p.) |
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Collana |
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Springer Series in Surface Sciences, , 0931-5195 ; ; 55 |
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Disciplina |
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Soggetti |
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Spectrum analysis |
Microscopy |
Materials—Surfaces |
Thin films |
Physical measurements |
Measurement |
Surfaces (Physics) |
Interfaces (Physical sciences) |
Spectroscopy and Microscopy |
Surfaces and Interfaces, Thin Films |
Measurement Science and Instrumentation |
Spectroscopy/Spectrometry |
Surface and Interface Science, Thin Films |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications. |
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Sommario/riassunto |
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Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality |
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