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1. |
Record Nr. |
UNINA9910299717903321 |
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Autore |
Franco Jacopo |
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Titolo |
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications / / by Jacopo Franco, Ben Kaczer, Guido Groeseneken |
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Pubbl/distr/stampa |
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Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014 |
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ISBN |
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Edizione |
[1st ed. 2014.] |
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Descrizione fisica |
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1 online resource (203 p.) |
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Collana |
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Springer Series in Advanced Microelectronics, , 1437-0387 ; ; 47 |
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Disciplina |
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Soggetti |
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Semiconductors |
Electronic circuits |
Optical materials |
Electronics - Materials |
Circuits and Systems |
Optical and Electronic Materials |
Electronic Circuits and Devices |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references. |
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Nota di contenuto |
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1 Introduction -- 2 Degradation mechanisms -- 3 Techniques and devices -- 4 Negative Bias Temperature Instability in (Si)Ge pMOSFETs -- 5 Negative Bias Temperature Instability in nanoscale devices -- 6 Channel Hot Carriers and other reliability mechanisms -- 7 Conclusions and perspectives. |
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Sommario/riassunto |
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Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a showstopper for further scaled technology nodes. Although several groups have already demonstrated functional Si channel devices with aggressively scaled Equivalent Oxide Thickness (EOT) down to 5Å, a 10 year reliable device operation cannot be guaranteed anymore due to severe Negative Bias Temperature Instability. This book focuses on the reliability of the novel (Si)Ge channel quantum well pMOSFET technology. This technology is being considered for possible implementation in next CMOS technology nodes, thanks to its benefit in terms of carrier mobility and device threshold voltage tuning. We observe that it also opens a degree of freedom for device reliability optimization. By properly tuning the |
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device gate stack, sufficiently reliable ultra-thin EOT devices with a 10 years lifetime at operating conditions are demonstrated. The extensive experimental datasets collected on a variety of processed 300mm wafers and presented here show the reliability improvement to be process- and architecture-independent and, as such, readily transferable to advanced device architectures as Tri-Gate (finFET) devices. We propose a physical model to understand the intrinsically superior reliability of the MOS system consisting of a Ge-based channel and a SiO2/HfO2 dielectric stack. The improved reliability properties here discussed strongly support (Si)Ge technology as a clear frontrunner for future CMOS technology nodes. |
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2. |
Record Nr. |
UNINA9910956571903321 |
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Autore |
Fair Ray C |
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Titolo |
Predicting presidential elections and other things / / Ray C. Fair |
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Pubbl/distr/stampa |
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Stanford, Calif., : Stanford Economics and Finance, c2012 |
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ISBN |
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Edizione |
[2nd ed.] |
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Descrizione fisica |
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1 online resource (234 p.) |
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Disciplina |
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Soggetti |
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Social prediction |
Presidents - United States - Election - Forecasting |
Election forecasting - United States |
Economic forecasting |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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It's the economy, stupid -- The tools in seven easy lessons -- Presidential elections -- Congressional elections -- Extramarital affairs -- Wine quality -- College grades and class attendance -- Marathon times -- Aging and baseball -- Predicting college football games -- Interest rates -- Inflation -- More things. |
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Sommario/riassunto |
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""It's the economy, stupid,"" as Democratic strategist James Carville would say. After many years of study, Ray C. Fair has found that the |
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state of the economy has a dominant influence on national elections. Just in time for the 2012 presidential election, this new edition of his classic text, Predicting Presidential Elections and Other Things, provides us with a look into the likely future of our nation's political landscape-but Fair doesn't stop there.Fair puts other national issues under the microscope as well-including congressional elections, Federal Reserve behavior |
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