1.

Record Nr.

UNINA9910299688103321

Autore

Deferm Noël

Titolo

CMOS Front Ends for Millimeter Wave Wireless Communication Systems / / by Noël Deferm, Patrick Reynaert

Pubbl/distr/stampa

Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015

ISBN

3-319-13951-7

Edizione

[1st ed. 2015.]

Descrizione fisica

1 online resource (188 p.)

Collana

Analog Circuits and Signal Processing, , 1872-082X

Disciplina

621.384

Soggetti

Electronic circuits

Electronics

Microelectronics

Circuits and Systems

Electronic Circuits and Devices

Electronics and Microelectronics, Instrumentation

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di bibliografia

Includes bibliographical references at the end of each chapters and index.

Nota di contenuto

Introduction -- CMOS at Millimeter Wave Frequencies -- Passive Devices: Simulation and Design -- Integrated Differential Amplifiers -- Millimeter Wave Transmitters in CMOS -- A 120GHz Wireless Link -- General Conclusions.

Sommario/riassunto

This book focuses on the development of circuit and system design techniques for millimeter wave wireless communication systems above 90GHz and fabricated in nanometer scale CMOS technologies. The authors demonstrate a hands-on methodology that was applied to design six different chips, in order to overcome a variety of design challenges. Behavior of both actives and passives, and how to design them to achieve high performance is discussed in detail. This book serves as a valuable reference for millimeter wave designers, working at both the transistor level and system level.   Discusses advantages and disadvantages of designing wireless mm-wave communication circuits and systems in CMOS; Analyzes the limitations and pitfalls of building mm-wave circuits in CMOS; Includes mm-wave building block and



system design techniques and applies these to 6 different CMOS chips; Provides guidelines for building measurement setups to evaluate high-frequency chips.  .