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1. |
Record Nr. |
UNINA9910459866503321 |
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Titolo |
Capital without borders : challenges to development / / edited by Ashwini Deshpande [[electronic resource]] |
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Pubbl/distr/stampa |
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London : , : Anthem Press, , 2010 |
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ISBN |
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1-283-37733-0 |
9786613377333 |
0-85728-957-8 |
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Descrizione fisica |
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1 online resource (xii, 238 pages) : digital, PDF file(s) |
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Collana |
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Disciplina |
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Soggetti |
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Capital movements |
International finance |
Investments, Foreign |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from publisher's bibliographic system (viewed on 02 Oct 2015). |
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Nota di bibliografia |
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Includes bibliographical references. |
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Nota di contenuto |
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How financial liberalization led in the 1990s to three different cycles of 'manias, panic and crashes' in middle income countries / José́ Gabriel Palma -- Timing the Mexican 1994-95 financial crisis using a Markov switching approach / Moritz Cruz and Edmund Amann -- Exchange rates, growth and inflation : what if the income elasticities of trade flows respond to relative prices? / Nelson H. Barbosa-Filho -- Alternative measures of currency and asset substitution : the case of Turkey / A. Ozden Birkan -- Competitive diversification in resource abundant countries : Argentina after the collapse of the convertibility regime / Leandro Serino -- Foreign portfolio investment, stock market and economic development : a case study in India / Parthapratim Pal -- Transnational corporations and the internationalization of research and development activities in developing countries : the relative importance of affiliates in Asia and Latin America / Celio Hiratuka -- External debt nationalization as a major tendency on Brazilian external debt in the twentieth century : the shifting character of the state during debt crisis / Luiz M. Niemeyer -- Prudential regulation and safety net : recent transformations in Brazil / Ana Rosa Ribeiro de Mendonca -- Re-crafting bilateral investment treaties in a development framework : a |
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comparative regional perspective / Biplove Choudhary and Parashar Kulkarni. |
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Sommario/riassunto |
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This volume examines different facets of international capital movements - the role of openness, the implications of large inflows of foreign capital and the impact of regulatory frameworks - from the point of view of the global South. |
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2. |
Record Nr. |
UNINA9910299666303321 |
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Titolo |
Circuit Design for Reliability / / edited by Ricardo Reis, Yu Cao, Gilson Wirth |
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Pubbl/distr/stampa |
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New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 |
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ISBN |
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Edizione |
[1st ed. 2015.] |
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Descrizione fisica |
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1 online resource (271 p.) |
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Disciplina |
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620 |
620.00420285 |
621.3815 |
658.56 |
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Soggetti |
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Electronic circuits |
Security systems |
Computer-aided engineering |
Electronic Circuits and Systems |
Security Science and Technology |
Computer-Aided Engineering (CAD, CAE) and Design |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references at the end of each chapters. |
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Nota di contenuto |
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Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs. |
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Sommario/riassunto |
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This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations. |
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