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Record Nr. |
UNINA9910461233603321 |
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Autore |
Turing Sara <1881-1976, > |
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Titolo |
Alan M. Turing / / Sara Turing ; with a foreword by Martin Davis and an afterword by John Turing [[electronic resource]] |
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Pubbl/distr/stampa |
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Cambridge : , : Cambridge University Press, , 2012 |
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ISBN |
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1-107-23133-7 |
1-107-38681-0 |
1-280-39420-X |
9786613572127 |
1-139-33795-5 |
1-139-34040-9 |
1-139-34198-7 |
1-139-33708-4 |
1-139-33882-X |
1-139-10573-6 |
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Edizione |
[Centenary ed.] |
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Descrizione fisica |
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1 online resource (xxiv, 169 pages) : digital, PDF file(s) |
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Disciplina |
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Soggetti |
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Mathematicians - Great Britain |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from publisher's bibliographic system (viewed on 05 Oct 2015). |
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Nota di bibliografia |
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Includes bibliographical references. |
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Nota di contenuto |
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Family background -- Childhood and early boyhood -- At Sherborne School -- At Cambridge -- At the graduate college, Princeton -- Some characteristics -- War work in the foreign office -- At the National Physical Laboratory, Teddington -- Work with the Manchester Automatic Digital Machine -- Broadcasts and intelligent machinery -- Morphogenesis -- Relaxation -- Last days and some tributes -- Computing machinery -- Theory of morphogenesis considered. |
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Sommario/riassunto |
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'In a short life he accomplished much, and to the roll of great names in the history of his particular studies added his own.' So is described one of the greatest figures of the twentieth century, yet Alan Turing's name was not widely recognised until his contribution to the breaking of the German Enigma code became public in the 1970s. The story of Turing's |
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life fascinates and in the years since his suicide, Turing's reputation has only grown, as his contributions to logic, mathematics, computing, artificial intelligence and computational biology have become better appreciated. To commemorate the centenary of Turing's birth, this republication of his mother's biography is enriched by a new foreword by Martin Davis and a never-before-published memoir by Alan's older brother. The contrast between this memoir and the original biography reveals tensions and sheds new light on Turing's relationship with his family, and on the man himself. |
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2. |
Record Nr. |
UNINA9910299666303321 |
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Titolo |
Circuit Design for Reliability / / edited by Ricardo Reis, Yu Cao, Gilson Wirth |
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Pubbl/distr/stampa |
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New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 |
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ISBN |
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Edizione |
[1st ed. 2015.] |
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Descrizione fisica |
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1 online resource (271 p.) |
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Disciplina |
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620 |
620.00420285 |
621.3815 |
658.56 |
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Soggetti |
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Electronic circuits |
Security systems |
Computer-aided engineering |
Electronic Circuits and Systems |
Security Science and Technology |
Computer-Aided Engineering (CAD, CAE) and Design |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references at the end of each chapters. |
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Nota di contenuto |
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Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit |
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Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs. |
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Sommario/riassunto |
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This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations. |
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