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1. |
Record Nr. |
UNINA9910455754003321 |
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Titolo |
Estimating eligibility and participation for the WIC program [[electronic resource] ] : final report / / Panel to Evaluate the USDA's Methodology for Estimating Eligibility and Participation for the WIC Program ; Michele Ver Ploeg and David M. Betson, editors |
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Pubbl/distr/stampa |
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Washington, D.C., : National Academies Press, c2003 |
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ISBN |
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1-280-17960-0 |
9786610179602 |
0-309-52551-9 |
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Descrizione fisica |
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1 online resource (218 p.) |
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Altri autori (Persone) |
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Ver PloegMichele |
BetsonDavid |
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Disciplina |
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Soggetti |
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Food relief - United States - Statistical methods |
Food relief - United States - Evaluation |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references. |
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Nota di contenuto |
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""Front Matter""; ""Acknowledgments""; ""Contents""; ""Executive Summary""; ""1 Introduction""; ""2 Overview of WIC and the Current Estimation Methodology""; ""3 Accuracy and Sources of Errors""; ""4 Categorical Eligibility of Infants and Children""; ""5 Income and Adjunctive Eligibility of Infants and Children""; ""6 Estimation of the Number of Income-Eligible Pregnant and Postpartum Women""; ""7 Estimating Eligibility Based on Meeting Nutritional Risk Criteria""; ""8 Estimating WIC Participation Among Eligible People""; ""9 Options for Estimating Eligibility and Participation"" |
""10 Summary""""References""; ""APPENDICES""; ""APPENDIX A Data Sources and Coverage Issues""; ""APPENDIX B Nutritional Screening and Budget Estimates""; ""APPENDIX C Reconciling Different Estimates of Income and Adjunctive Eligibility""; ""APPENDIX D Biographical Sketches of Panel Members and Staff"" |
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2. |
Record Nr. |
UNINA9910299499303321 |
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Autore |
Demkov Alexander A |
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Titolo |
Integration of Functional Oxides with Semiconductors / / by Alexander A. Demkov, Agham B. Posadas |
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Pubbl/distr/stampa |
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New York, NY : , : Springer New York : , : Imprint : Springer, , 2014 |
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ISBN |
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Edizione |
[1st ed. 2014.] |
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Descrizione fisica |
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1 online resource (284 p.) |
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Collana |
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SpringerBriefs in Materials |
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Disciplina |
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537.622 |
620 |
620.11295 |
620.11297 |
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Soggetti |
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Electronics |
Microelectronics |
Optical materials |
Electronics - Materials |
Semiconductors |
Electronics and Microelectronics, Instrumentation |
Optical and Electronic Materials |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Introduction -- Critical issues in Oxide-Semiconductor Heteroepitaxy -- Predictive Engineering of Semiconductor-Oxide Interfaces -- Crystalline Functional Oxide Growth Methods -- Thin Oxide Film Characterization Methods -- Growing SrTiO3 on Si (001) by Molecular Beam Epitaxy -- Integration of Functional Oxides on SrTiO3/Si Pseudo-Substrates -- Other Epitaxial Oxides on Semiconductors -- Outlook and Parting Thoughts -- Appendices. |
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Sommario/riassunto |
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This unique book describes the basic physical principles of the oxide/semiconductor epitaxy and offers a view of the current state of the field. It shows how this technology enables large-scale integration of oxide electronic and photonic devices, and describes possible hybrid semiconductor/oxide systems. The book incorporates both theoretical and experimental advances to explore the heteroepitaxy of tuned |
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functional oxides and semiconductors to identify material, device and characterization challenges, and to present the incredible potential in the realization of multifunctional devices and monolithic integration of materials and devices. This book also: · Discusses why semiconductor substrates are an excellent integration platform for making hybrid logic/sensor devices · Provides a brief introduction to the methods accessible to non-experts, before going into details of interest to the experts · Includes a detailed glossary that explains the specialized terminology and provides insight into the terminology and how it’s used. |
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