1.

Record Nr.

UNINA9910298651603321

Autore

Thomas Jürgen

Titolo

Analytical Transmission Electron Microscopy : An Introduction for Operators / / by Jürgen Thomas, Thomas Gemming

Pubbl/distr/stampa

Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014

ISBN

94-017-8601-1

Edizione

[1st ed. 2014.]

Descrizione fisica

1 online resource (XVII, 348 p. 238 illus., 33 illus. in color.)

Disciplina

620.11

Soggetti

Materials science

Spectroscopy

Microscopy

Nanotechnology

Characterization and Evaluation of Materials

Spectroscopy and Microscopy

Spectroscopy/Spectrometry

Nanotechnology and Microengineering

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

"This book is the revised and slightly expanded translation of the German book edition by Jürgen Thomas and Thomas Gemming: "Analytische Transmissionelektronenmikroskopie-- Eine Einführung für den Praktiker", Springer-Verlag, Wien 2013."

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

From the Contents: Why this effort? -- What should we know about electron optics and the construction of an electron microscope -- We prepare electron-transparent samples -- Let us start with the work -- Let us switch to electron diffraction -- Why do we see any contrasts in the images? -- We increase the magnification -- Let us switch to scanning transmission electron microscopy -- Let us use the analytical possibilities -- Basics explained in more detail (a little bit more mathematics).

Sommario/riassunto

This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal



points. This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.