1.

Record Nr.

UNINA9910254027503321

Titolo

Oxide Materials at the Two-Dimensional Limit / / edited by Falko P. Netzer, Alessandro Fortunelli

Pubbl/distr/stampa

Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016

ISBN

3-319-28332-4

Edizione

[1st ed. 2016.]

Descrizione fisica

1 online resource (403 p.)

Collana

Springer Series in Materials Science, , 0933-033X ; ; 234

Disciplina

546.7212

Soggetti

Optical materials

Electronics - Materials

Surfaces (Physics)

Interfaces (Physical sciences)

Thin films

Nanochemistry

Semiconductors

Materials—Surfaces

Optical and Electronic Materials

Surface and Interface Science, Thin Films

Surfaces and Interfaces, Thin Films

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di bibliografia

Includes bibliographical references at the end of each chapters and index.

Nota di contenuto

Ultrathin oxide films on Au(111) substrates -- Surface chemistry on oxide nanostructures -- Electronic structure methods for nanostructured interfaces -- 2-D titania systems -- Properties of reducible oxides as ultrathin films -- 2-D ceria systems -- Structure concepts in 2-D oxide materials -- Polarity in 2-D oxides -- Doping aspects in 2-D oxides -- Charge transfer effects in ultrathin oxide films -- Phonons in 2-D oxide systems -- Defects at interfaces of Si and 2-D oxide films -- Ultrathin films of ternary oxides -- 2-D oxide interfaces.

Sommario/riassunto

This book summarizes the current knowledge of two-dimensional oxide materials. The fundamental properties of 2-D oxide systems are



explored in terms of atomic structure, electronic behavior and surface chemistry.  The concept of polarity in determining the stability of 2-D oxide layers is examined, charge transfer effects in ultrathin oxide films are reviewed as well as the role of defects in 2-D oxide films. The novel structure concepts that apply in oxide systems of low dimensionality are addressed,  and a chapter giving an overview of state-of-the-art theoretical methods for electronic structure determination of nanostructured oxides is included. Special emphasis is given to a balanced view from the experimental and the theoretical side. Two-dimensional materials, and 2-D oxides in particular, have outstanding behavior due to dimensionality and proximity effects. Several chapters treat prototypical model systems as illustrative examples to discuss the peculiar physical and chemical properties of 2-D oxide systems. The chapters are written by renowned experts in the field.