Record Nr.

UNINA9910164289503321

Titolo

Recombination lifetime measurements in silicon

Pubbl/distr/stampa


[Place of publication not identified], : ASTM, 1998

ISBN

0-8031-5389-9

Disciplina

621.3815/2

Soggetti

Semiconductors - Testing - Congresses

Service life (Engineering) - Congresses - Forecasting

Electronic measurements - Congresses

Electrical & Computer Engineering

Engineering & Applied Sciences

Electrical Engineering

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph