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Record Nr. |
UNINA9910146829703321 |
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Titolo |
2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX |
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Pubbl/distr/stampa |
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[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 |
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ISBN |
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Disciplina |
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Soggetti |
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Integrated circuits - Testing |
Semiconductors - Testing |
Electronics |
Electrical Engineering |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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