1.
Record Nr.
UNINA9910146457403321
Titolo
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
Pubbl/distr/stampa
[Place of publication not identified], : IEEE Electron Devices Society, 2005
ISBN
1-5090-9773-2
Soggetti
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration
Lingua di pubblicazione
Inglese
Formato
Materiale a stampa
Livello bibliografico
Monografia
Note generali
Bibliographic Level Mode of Issuance: Monograph