VLSI test principles and architectures [[electronic resource] ] : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

• Record Nr.: UNINA9910458608703321
• Pubbl/distr/stampa: Amsterdam ; ; Boston, : Elsevier Morgan Kaufmann Publishers, c2006
• ISBN: 1-280-96684-X; 9786610966844; 0-08-047479-9
• Edizione: [1st edition]
• Descrizione fisica: 1 online resource (809 p.)
• Collana: The Morgan Kaufmann series in systems on silicon
• Altri autori (Persone): WangLaung-Terng; WuCheng-Wen, EE Ph. D.; WenXiaoqing
• Disciplina: 621.39/5
• Soggetti: Integrated circuits - Very large scale integration - Testing; Integrated circuits - Very large scale integration - Design; Electronic books.
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Front cover; Title page; Copyright page; Table of contents; Preface; In the Classroom; Acknowledgments; Contributors; About the Editors; 1 Introduction; Importance of Testing; Testing During the VLSI Lifecycle; VLSI Development Process; Design Verification; Yield and Reject Rate; Electronic System Manufacturing Process; System-Level Operation; Challenges in VLSI Testing; Test Generation; Fault Models; Stuck-At Faults; Transistor Faults; Open and Short Faults; Delay Faults and Crosstalk; Pattern Sensitivity and Coupling Faults; Analog Fault Models; Levels of Abstraction in VLSI Testing; Register-Transfer Level and Behavioral Level Gate Level; Switch Level; Physical Level; Historical Review of VLSI Test Technology; Automatic Test Equipment; Automatic Test Pattern Generation; Fault Simulation; Digital Circuit Testing; Analog and Mixed-Signal Circuit Testing; Design for Testability; Board Testing; Boundary Scan Testing; Concluding Remarks; Exercises; Acknowledgments; References; 2 Design for Testability; Introduction; Testability Analysis; SCOAP Testability ; Analysis; Combinational Controllability and Observability Calculation; Sequential Controllability and Observability Calculation Probability-Based Testability Analysis; Simulation-Based Testability Analysis; RTL Testability Analysis; Design for Testability Basics; Ad Hoc Approach; Test Point Insertion; Structured Approach; Scan Cell Designs; Muxed-D Scan Cell; Clocked-Scan Cell; LSSD Scan Cell; Scan Architectures; Full-Scan Design; Muxed-D Full-Scan Design; Clocked Full-Scan Design; LSSD Full-Scan Design; Partial-Scan Design; Random-Access Scan Design; Scan Design Rules; Tristate Buses; Bidirectional I/O Ports; Gated Clocks; Derived Clocks; Combinational Feedback Loops Asynchronous Set/Reset Signals; Scan Design Flow; Scan Design Rule Checking and Repair; Scan Synthesis; Scan Configuration; Scan Replacement; Scan Reordering; Scan Stitching; Scan Extraction; Scan Verification; Verifying the Scan Shift Operation; Verifying the Scan Capture Operation; Scan Design Costs; Special-Purpose Scan Designs; Enhanced Scan; Snapshot Scan; Error-Resilient Scan; RTL Design for Testability; RTL Scan Design Rule Checking and Repair; RTL Scan Synthesis; RTL Scan Extraction and Scan Verification; Concluding Remarks; Exercises; Acknowledgments; References 3 Logic and Fault Simulation; Introduction; Logic Simulation for Design Verification; Fault Simulation for Test and Diagnosis; Simulation Models; Gate-Level Network; Sequential Circuits; Logic Symbols; Unknown State u; High-Impedance State Z; Intermediate Logic States; Logic Element Evaluation; Truth Tables; Input Scanning; Input Counting; Parallel Gate Evaluation; Timing Models; Transport Delay; Inertial Delay; Wire Delay; Functional Element Delay Model; Logic Simulation; Compiled-Code Simulation; Logic Optimization; Logic Levelization; Code Generation; Event-Driven Simulation; Nominal-Delay Event-Driven Simulation
• Sommario/riassunto: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.·

Silicon chemistry [[electronic resource] ] : from the atom to extended systems / / Peter Jutzi, Ulrich Schubert (eds.)

• Record Nr.: UNINA9910144302603321
• Pubbl/distr/stampa: Weinheim ; ; [Cambridge], : Wiley-VCH, c2003
• ISBN: 1-281-08785-8; 1-282-13983-5; 9786612139833; 9786611087852; 3-527-61076-6; 3-527-61121-5
• Descrizione fisica: 1 online resource (508 p.)
• Altri autori (Persone): JutziPeter; SchubertU (Ulrich)
• Disciplina: 540.8; 546.683
• Soggetti: Silicon; Silicon compounds; Electronic books.
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Silicon Chemistry; Foreword; Acknowledgement; Contents; Part I Reactive Intermediates in Silicon Chemistry - Synthesis, Characterization, and Kinetic Stabilization; Introduction; 1 Investigations on the Reactivity of Atomic Silicon: A Playground for Matrix Isolation Spectroscopy; 2 Reactions with Matrix-Isolated SiO Molecules; 3 In situ Diagnostics of Amorphous Silicon Thin Film Deposition; 4 The Gas-Phase Oxidation of Silyl Radicals by Molecular Oxygen: Kinetics and Mechanisms; 5 Oxidation of Matrix-Isolated Silylenes; 13 Structural and Electronic Systematics in Zintl Phases of the Tetrels14 Zintl Phases MSi(2) (M = Ca, Eu, Sr, Ba) at Very High Pressure; 15 Silicon- and Germanium-Based Sheet Polymers and Zintl Phases; 16 Kautsky-Siloxene Analogous Monomers and Oligomers; 17 Silicon-based Nanotubes: A Theoretical Investigation; 18 Structure and ; Reactivity of Solid SiO; 19 Si Nanocrystallites in SiO(x) Films by Vapour Deposition and Thermal Processing; 20 Theoretical Treatment of Silicon Clusters; 21 Isomers of Neutral Silicon Clusters; 22 Investigation of the Influence of Oxidation and HF Attack on the Photoluminescence of Silicon Nanoparticles23 Localization Phenomena and Photoluminescence from Nano-structured Silicon and from Silicon/Silicon Dioxide Nanocomposites; Part III Si-O Systems: From Molecular Building Blocks to Extended Networks; Introduction; 24 Higher-Coordinate Silicon Compounds with SiO(5) and SiO(6) Skeletons; 25 Functionalized Silanols and Silanolates; 26 Transition Metal Fragment Substituted Silanols of Iron and Tungsten - Synthesis, Structure, and Condensation Reactions; 27 Rational Syntheses of Cyclosiloxanes and Molecular Alumo- and Gallosiloxanes28 Synthesis, Structure, and Reactivity of Novel Oligomeric Titanasiloxanes; 29 Metallasilsesquioxanes - Synthetic and Structural Studies; 30 Spin-Spin Interactions in Silsesquioxanes and Transition Metal Substitution; 31 Characterization of Silicon-Containing Polymers by Coupling of HPLC-Separation Methods with MALDI-TOF Mass Spectrometry; 32 The Stepwise Formation of Si-O Networks; 33 Mechanism of Ring and Cage Formation in Siloxanes; 34 Structurally Well-Defined Amphiphilic Polysiloxane Copolymers; 35 Synthesis and Functionalization of Mesostructured Silica-Based Films
• Sommario/riassunto: The combined results from an international research project involving 40 interdisciplinary groups, providing the latest knowledge from the past few years. Adopting an application-oriented approach, this handy reference is a must-have for every silicon chemist, whether working in inorganic, organic, physical or polymer chemistry, materials science or physics.