1.

Record Nr.

UNINA9910143624103321

Titolo

Advances in Pattern Recognition : Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings / / edited by Francesc J. Ferri, Jose M. Inesta, Adnan Amin, Pavel Pudil

Pubbl/distr/stampa

Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2000

ISBN

3-540-44522-6

Edizione

[1st ed. 2000.]

Descrizione fisica

1 online resource (XXXVI, 904 p.)

Collana

Lecture Notes in Computer Science, , 0302-9743 ; ; 1876

Disciplina

006.4

Soggetti

Pattern recognition

Optical data processing

Application software

Computer graphics

Artificial intelligence

Pattern Recognition

Image Processing and Computer Vision

Computer Applications

Computer Graphics

Artificial Intelligence

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph

Nota di bibliografia

Includes bibliographical references at the end of each chapters and index.

Nota di contenuto

Invited Papers -- Pierre Devijver Lecture -- Hybrid and Combined Methods -- Applications -- Document Image Analysis -- Grammar and Language Methods -- Structural Matching -- Graph-Based Methods -- Shape Analysis -- SSPR Poster Session -- Clustering and Density Estimation -- Object Recognition -- General Methodology I -- General Methodology II -- Feature Extraction and Selection -- SPR Poster Session.

Sommario/riassunto

This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern



Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.