1.

Record Nr.

UNINA9910142521703321

Titolo

Layer of protection analysis [[electronic resource] ] : simplified process risk assessment

Pubbl/distr/stampa

New York, : Center for Chemical Process Safety of the American Institute of Chemical Engineers, c2001

ISBN

1-282-78340-8

9786612783401

0-470-93559-6

1-59124-445-5

0-470-93558-8

Descrizione fisica

1 online resource (292 p.)

Collana

CCPS concept book

Disciplina

660.2804

660/.2804

Soggetti

Chemical plants - Risk assessment

Electronic books.

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

Layer of Protection Analysis: Simplified Process Risk Assessment; Contents; Preface; Acknowledgments; Acronyms and Abbreviations; 1 Introduction; 2 Overview of LOPA; 3 Estimating Consequences and Severity; 4 Developing Scenarios; 5 Identifying Initiating Event Frequency; 6 Identifying Independent Protection Layers; 7 Determining the Frequency of Scenarios; 8 Using LOPA to Make Risk Decisions; 9 Implementing LOPA; 10 Using LOPA for Other Applications; 11 Advanced LOPA Topics; APPENDIX A: LOPA Summary Sheets for the Continuing Examples

APPENDIX B: Worked Examples from CCPS's Safe Automation BookAPPENDIX C: Documentation for a LOPA Study; APPENDIX D: Linkage with Other Publications; APPENDIX E: Industry Risk Tolerance Criteria Data; APPENDIX F: High Initiating Event Frequency Scenarios; APPENDIX G: Additional Reading; References; Glossary of Terms; Index

Sommario/riassunto

Layer of protection analysis (LOPA) is a recently developed, simplified method of risk assessment that provides the much-needed middle



ground between a qualitative process hazard analysis and a traditional, expensive quantitative risk analysis. Beginning with an identified accident scenario, LOPA uses simplifying rules to evaluate initiating event frequency, independent layers of protection, and consequences to provide an order-of-magnitude estimate of risk. LOPA has also proven an excellent approach for determining the safety integrity level necessary for an instrumented safety system, an app

2.

Record Nr.

UNISA996218665303316

Titolo

Visual Culture / / edited by Chris Jenks

Pubbl/distr/stampa

London : , : Routledge, , [2017?]

©1995

ISBN

1-351-53751-2

1-134-84479-4

1-138-13769-3

1-315-08424-4

1-351-53752-0

1-138-87998-3

0-203-42644-4

0-203-29890-X

1-280-15686-4

1-134-84480-8

Descrizione fisica

1 online resource (282 p.)

Disciplina

306

700.103

700/.1/03

Soggetti

Arts, Modern - 20th century

Arts and society

Popular culture

Visual communication

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Originally published in print: 1995.



Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

Book Cover; Title; Contents; List of figures; List of contributors; Acknowledgements; THE CENTRALITY OF THE EYE IN WESTERN CULTURE: AN INTRODUCTION; ADVERTISING: THE RHETORICAL IMPERATIVE; REPORTING AND VISUALISING; FRACTURED SUBJECTIVITY; THE CITY, THE CINEMA: MODERN SPACES; FABULOUS CONFUSION! POP BEFORE POP?; AN ART OF SCHOLARS: CORRUPTION, NEGATION AND PARTICULARITY IN PAINTINGS BY RYMAN AND RICHTER; WATCHING YOUR STEP: THE HISTORY AND PRACTICE OF THE FLNEUR; REICH DREAMS: RITUAL HORROR AND ARMOURED BODIES; TELEVISION: NOT SO MUCH A VISUAL MEDIUM, MORE A VISIBLE OBJECT

FOUCAULT'S OPTICS: THE (IN) VISION OF MORTALITY AND MODERNITYMANAGING 'TRADITION': THE PLIGHT OF AESTHETIC PRACTICES AND THEIR ANALYSIS IN A TECHNOSCIENTIFIC CULTURE; PHOTOGRAPHY AND MODERN VISION: THE SPECTACLE OF 'NATURAL MAGIC'; THREE IMAGES OF THE VISUAL: EMPIRICAL, FORMAL AND NORMATIVE; Index

Sommario/riassunto

This collection of original and exciting essays explores the 'visual' character of contemporary culture. Examining film, painting, propaganda, photography and television, this is an indispensible guide to this field.