| |
|
|
|
|
|
|
|
|
1. |
Record Nr. |
UNINA9910142332303321 |
|
|
Titolo |
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan |
|
|
|
|
|
|
|
Pubbl/distr/stampa |
|
|
[Place of publication not identified], : IEEE Computer Society, 2005 |
|
|
|
|
|
|
|
ISBN |
|
|
|
|
|
|
Disciplina |
|
|
|
|
|
|
Soggetti |
|
Semiconductor storage devices - Testing |
Random access memory |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
Electrical Engineering |
|
|
|
|
|
|
|
|
Lingua di pubblicazione |
|
|
|
|
|
|
Formato |
Materiale a stampa |
|
|
|
|
|
Livello bibliografico |
Monografia |
|
|
|
|
|
Note generali |
|
Bibliographic Level Mode of Issuance: Monograph |
|
|
|
|
|
| |