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1. |
Record Nr. |
UNINA9910141419603321 |
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Autore |
Jones Stephanie <1957-> |
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Titolo |
BRICS and beyond [[electronic resource] ] : executive lessons on emerging markets / / Stephanie Jones |
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Pubbl/distr/stampa |
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Chichester [England], : Wiley, 2012 |
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ISBN |
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1-119-20818-1 |
1-280-69674-5 |
9786613673701 |
1-118-35156-8 |
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Descrizione fisica |
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1 online resource (303 p.) |
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Disciplina |
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Soggetti |
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International business enterprises - Developing countries |
Social responsibility of business - Developing countries |
Diversity in the workplace - Developing countries |
Industrial management - Developing countries |
Electronic books. |
BRIC countries Foreign economic relations |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Preface / by Prof Dr. Wim Naude -- About the author -- Introduction -- Doing business in emerging markets : risks, opportunities and practice -- First section: risks -- Country risk -- Politics and business in emerging markets -- Corporate social responsibility -- Ethics, transparency, and governance in emerging markets -- Business culture -- Cross-cultural management and people in emerging markets -- Second section: opportunities -- Marketing -- Implementing marketing ideas into and from emerging markets -- Entrepreneurship and innovation -- Technology, innovation, and new business ventures in emerging markets -- Third section: practice -- Strategy and operations -- Changing business strategies and operations in emerging markets -- Strategic alliances -- Western business and emerging market business : working together -- Lessons for global business -- What we can learn from the brics and beyond -- Reading list -- Glossary -- Index. |
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Sommario/riassunto |
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BRICs and Beyond is an international business executive text written especially for executive and MBA students. It is based on extensive consulting in emerging economies and several years of experience teaching executive MBA courses around the globe. The author has continually faced the problem that the available textbooks for teaching international business focused almost exclusively on examples of Western multinationals for case illustrations. In the process of preparing cases nearer to the emerging market she worked in, the author realized that the often fascinating, frequently in |
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2. |
Record Nr. |
UNICASRML0233627 |
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Autore |
LUERTI, Angelo |
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Titolo |
Credit scoring delle imprese : Analisi di bilancio e cash flow : modello AL/93 su software elaborato in base alla IV Direttiva CEE / Angelo Luerti |
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Pubbl/distr/stampa |
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Milano, : ETAS Libri, 1992 |
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Descrizione fisica |
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hetti) : il modello AL/93 di credit scoring elaborato in base alla 4 Direttiva CEE / Angelo Luerti (Gestione d'impresa. Finanza) IS ; 25 cm. (ETAS software) ISBN 88 453 0548 1 La previsione dello stato di insolvenza delle imprese |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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3. |
Record Nr. |
UNINA9910510584003321 |
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Autore |
Taudt Christopher |
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Titolo |
Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry |
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Pubbl/distr/stampa |
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Wiesbaden, : Springer Fachmedien Wiesbaden GmbH, 2021 |
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ISBN |
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Edizione |
[1st ed.] |
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Descrizione fisica |
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1 online resource (180 p.) |
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Collana |
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Classificazione |
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Soggetti |
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Optical physics |
Mensuration & systems of measurement |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di contenuto |
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Intro -- Acknowledgements -- Abstract -- Contents -- List of Symbols -- List of Figures -- List of Tables -- 1 Introduction and Motivation -- 2 Related Works and Basic Considerations -- 2.1 Profilometry -- 2.1.1 Atomic Force Microscopy -- 2.1.2 Confocal Laser Scanning Microscopy -- 2.1.3 Digital Holographic Microscopy -- 2.1.4 Phase-shifting Interferometry -- 2.1.5 Coherence Scanning Interferometry -- 2.1.6 Low-coherence Interferometry -- 2.2 Polymer Cross-linking Characterization -- 2.2.1 Soxhlet-type Extraction -- 2.2.2 Differential Scanning Caliometry -- 2.2.3 Dynamic Mechanical Analysis -- 2.2.4 Spectroscopy-based Methods -- 2.2.5 Low-coherence Interferometry and Other Optical Methods -- 2.2.6 Spatially-resolved Approaches -- 2.3 Film Thickness Measurement -- 2.3.1 Spectral Reflectometry -- 2.3.2 Spectroscopic Ellipsometry -- 2.4 Material dispersion -- 2.4.1 Thermo-optic coefficient -- 2.4.2 Photo-elastic influences -- 2.4.3 Characterization of dispersion -- 3 Surface Profilometry -- 3.1 Experimental Setup -- 3.2 Measurement Range and Resolution -- 3.3 Signal Formation and Analysis -- 3.3.1 Fitting of Oscillating Data -- 3.3.2 Frequency Analysis -- 3.3.3 Two-Stage Fitting -- 3.3.4 Error Estimation of the Data Processing -- 3.4 Two-Dimensional Approach and Characterization -- 3.4.1 Height Standard Evaluation -- 3.4.2 Repeatability and Resolution Characterization -- 3.4.3 Edge Effects -- 3.4.4 Roughness Evaluation -- 3.4.5 High-Dynamic Range |
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Measurements -- 3.4.6 Dual-Channel Approach -- 3.5 Areal Measurement Approaches -- 3.5.1 Translation-Based Areal Information -- 3.5.2 Alternative Spectral Encoding for Areal Measurements -- 4 Polymer Characterization -- 4.1 Temporal Approach -- 4.2 Scan-free Approach -- 4.2.1 Wrapped-phase Derivative Evaluation (WPDE) -- 4.2.2 Spatially-resolved Approaches -- 4.3 Influences and Limitations. |
4.3.1 Error Parameters of the Temporal Approach -- 4.3.2 Error Propagation in WPDE -- 5 Thin-film Characterization -- 5.1 Setup Considerations -- 5.2 Characterization of Thin-films on Bulk Substrates -- 5.3 Characterization of Flexible Substrate Materials -- 6 Conclusion -- A Glossary -- Publications -- Bibliography. |
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Sommario/riassunto |
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This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. |
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