Developments in dielectric materials and electronic devices [[electronic resource] ] : proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004) / / editors, K.M. Nair ... [et al.]

• Record Nr.: UNINA9910141280303321
• Pubbl/distr/stampa: Westerville, Ohio, : American Ceramic Society, c2005
• ISBN: 1-280-67403-2; 9786613650962; 1-118-40818-7; 1-118-40819-5
• Descrizione fisica: 1 online resource (430 p.)
• Collana: Ceramic transactions ; ; v. 167
• Altri autori (Persone): NairK. M <1933-> (K. Manikantan)
• Soggetti: Dielectric devices; Dielectrics - Materials; Electronics - Materials; Electronic books.
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and indexes.
• Nota di contenuto: Developments in Dielectric Materials and Electronic Devices; Contents; Preface; Material Design, Synthesis & Properties; Hydrothermal Synthesis and Properties of Sodium-Doped Bismuth Titanate Powders; Novel Processing of Functional Ceramic Films by CSD with UV Irradiation; Processing and Dielectric Properties of La(Zn1/2Ti1/2)O3 and Nd(Zn1/2Ti1/2)O3; Effect of Synthesis Parameters on Nanocrystalline PZT Powder; Nanocrystalline Lead Free Piezoceramic (KxNa1-x)NbO3 Derived From Microemulsion Mediated Synthesis; Variable-Temperature Microwave Dielectric Properties of Single-Crystal Fluorides; Temperature and Frequency Dependence of Dielectric Properties in BSTThe Optical and Electrical Properties of Nanocrystalline La0.4Sr0.6TiO3 Thin Films; Relationship Between Microstructure and Electrical Properties in Various Rare-Earth Doped BME Materials; Effects of Lead Stoichiometry on the Microstructure and Mechanical Properties of PZT ; 95/5; Microstructure Evolution and Ferroelectric Domains in Nb2O5 and CaZrO3 Doped BaTiO3; Microstructure and Microwave Dielectric Properties of (1-x)ZnNb2O6-xZnTa2O6 Ceramics; The Synergistic Effects of Nb/Mn and Sb/Mn on the Microstructure and Electrical Characteristics of BaTiO3 Based CeramicsThermoelectric Properties of Ca-Doped (ZnO)mln2O3 Ceramics and Their Improvement Upon Texture; Materials for Electronic Devices; BaTiO3: From Nanopowders to Dense Nanocrystalline Ceramics; Crystallization, Microstructure and Dielectric Properties of PbO-BaO-SrO-Nb2O5-B2O3-SiO2 Based Glass-Ceramics; Polarization Properties and Ferroelectric Distortion of La-Substituted Bi4Ti3O12 Ceramics: Comparisons with V- and Nb-Doped Ceramics; Dielectric Ceramics from the TiO2-TeO2 and Bi2O3-TeO2 SystemsOrigin of High Dielectric Properties of NM-Sized Barium Titanate Crystallites; Piezoelectric Properties of Bismuth Sodium Titanate Ceramics; Nonlead Perovskite Piezoelectric Materials; MEMS Device Arrays Using Thick Composite PZT Films; Thick Piezoelectric Films from Laser Transfer Process; Multilayer Devices Comprised of Piezoceramic Thin Films on Dielectric Substrates; Dielectric Properties and Tunability of (Ba1-xSrxTiO3:MgO Composites; Dynamic Linear Electrooptic Property Influnced by Piezoelectric Resonance in PMN-PT Crystals; Electronic Devices & ApplicationsType I Base-Metal Electrode Multilayer Ceramic Capacitors; Properties of FRAM Capacitors with Oxide Electrodes; Impedance Analysis of BME Dielectric Ceramics; Electron Microscopy of Heterogeneous Interfaces in Cofired Noble and Base Metal Electrode Multilayer Ceramic Capacitors (MLCCS); Latex-Ferroelectric Composites; Comparison of Bulk and Thin-Film Ferroelectrics-A Device Perspective; Direct-Charge Capacitor Modeling; Novel BaTiO3-Ag Composites with Ultra-High Dielectric Constants Satisfying X7R Specifications; Novel Board Material Technology for Next-Generation Microelectronic Packaging
• Sommario/riassunto: Papers in this volume include topics such as materials synthesis and processing; relaxors; novel compositions; material design; materials for multilayer electronic devices; processing-microstructure-property relationship; applications; environmental issues; and economic/cost analysis of tomorrow's electronic devices. Includes 38 papers.