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1. |
Record Nr. |
UNINA9910139243203321 |
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Titolo |
Journal of survey statistics and methodology |
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Pubbl/distr/stampa |
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Cary, NC : , : Oxford University Press, , 2013- |
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Descrizione fisica |
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Disciplina |
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Soggetti |
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Social surveys |
Surveys - Methodology |
Surveys - Statistical methods |
Periodicals. |
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Lingua di pubblicazione |
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Materiale a stampa |
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Livello bibliografico |
Periodico |
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2. |
Record Nr. |
UNINA9910870868603321 |
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Autore |
Maiti C. K |
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Titolo |
Strain-Engineered MOSFETs / C. K. Maiti, T. K. Maiti |
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Pubbl/distr/stampa |
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Boca Raton : , : CRC Press, , 2012 |
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Descrizione fisica |
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Soggetti |
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Technology & Engineering / Electronics / Microelectronics |
Technology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Sommario/riassunto |
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This book brings together new developments in the area of strain-engineered MOSFETs using high-mibility substrates such as SIGe, |
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strained-Si, germanium-on-insulator and III-V semiconductors into a single text which will cover the materials aspects, principles, and design of advanced devices, their fabrication and applications. The book presents a full TCAD methodology for strain-engineering in Si CMOS technology involving data flow from process simulation to systematic process variability simulation and generation of SPICE process compact models for manufacturing for yield optimization. |
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