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1. |
Record Nr. |
UNISA990000935200203316 |
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Autore |
SOUPA, Anne |
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Titolo |
Esiste il diavolo ? : che cosa ne dicono la Bibbia e la psicologia / Anne Soupa, Marie-Michéle Bourrat ; [traduzione dal francese di Renzùo Fenoglio] |
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Pubbl/distr/stampa |
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ISBN |
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Descrizione fisica |
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Collana |
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Spazi per lo spirito ; 11 |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Collocazione |
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II.2.2682(XIV COLL 169/11) |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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2. |
Record Nr. |
UNINA9910139078003321 |
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Autore |
Jenkins Ron <1932-> |
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Titolo |
Introduction to X-ray powder diffractometry / / Ron Jenkins, Robert L. Snyder |
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Pubbl/distr/stampa |
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ISBN |
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9786613905482 |
9781283593038 |
1283593033 |
9781118520918 |
1118520912 |
9781118520994 |
1118520998 |
9781118520925 |
1118520920 |
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Descrizione fisica |
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1 online resource (428 p.) |
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Collana |
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Chemical analysis ; ; v. 138 |
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Altri autori (Persone) |
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SnyderR. L <1941-> (Robert L.) |
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Disciplina |
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Soggetti |
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X-rays - Diffraction - Technique |
X-ray diffractometer |
Powders - Optical properties - Measurement |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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"A Wiley-Interscience publication." |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Introduction to X-ray Powder Diffractometry; CONTENTS; PREFACE; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1. CHARACTERISTICS OF X-RADIATION; 1.1. Early Development of X-ray Diffraction; 1.2. Origin of X-radiation; 1.3. Continuous Radiation; 1.4. Characteristic Radiation; 1.4.1. The Photoelectric Effect; 1.4.2. The Auger Effect; 1.4.3. Fluorescent Yield; 1.4.4. Selection Rules; 1.4.5. Nondiagram Lines; 1.4.6. Practical Form of the Copper K Spectrum; 1.5. Scattering of X-rays; 1.5.1. Coherent Scatter; 1.5.2. Compton Scatter; 1.6. Absorption of X-rays; 1.7. Safety Considerations |
ReferencesCHAPTER 2. THE CRYSTALLINE STATE; 2.1. Introduction to the Crystalline State; 2.2. Crystallographic Symmetry; 2.2.1. Point Groups and Crystal Systems; 2.2.2. The Unit Cell and Bravais Lattices; |
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2.2.3. Reduced Cells; 2.2.4. Space Groups; 2.3. Space Group Notation; 2.3.1. The Triclinic or Anorthic Crystal System; 2.3.2. The Monoclinic Crystal System; 2.3.3. The Orthorhombic Crystal System; 2.3.4. The Tetragonal Crystal System; 2.3.5. The Hexagonal and Trigonal Crystal Systems; 2.3.6. The Cubic Crystal System; 2.3.7. Equivalent Positions; 2.3.8. Special Positions and Site Multiplicity |
2.4. Space Group Theory2.5. Crystallographic Planes and Miller Indices; References; CHAPTER 3. DIFFRACTION THEORY; 3.1. Diffraction of X-rays; 3.2. The Reciprocal Lattice; 3.3. The Ewald Sphere of Reflection; 3.4. Origin of the Diffraction Pattern; 3.4.1. Single Crystal Diffraction; 3.4.2. The Powder Diffraction Pattern; 3.5. The Location of Diffraction Peaks; 3.6. Intensity of Diffraction Peaks; 3.6.1. Electron Scattering; 3.6.2. The Atomic Scattering Factor; 3.6.3. Anomalous Scattering; 3.6.4. Thermal Motion; 3.6.5. Scattering of X-rays by a Crystal: The Structure Factor |
3.7. The Calculated Diffraction Pattern3.7.1. Factors Affecting the Relative Intensity of Bragg Reflections; 3.7.2. The Intensity Equation; 3.8. Calculation of the Powder Diffraction Pattern of KCl; 3.9. Anisotropic Distortions of the Diffraction Pattern; 3.9.1. Preferred Orientation; 3.9.2. Crystallite Size; 3.9.3. Residual Stress and Strain; References; CHAPTER 4. SOURCES FOR THE GENERATION OF X-RADIATION; 4.1. Components of the X-ray Source; 4.2. The Line-Voltage Supply; 4.3. The High-Voltage Generator; 4.3.1. Selection of Operating Conditions; 4.3.2. Source Stability |
4.4. The Sealed X-ray Tube4.4.1. Typical X-ray Tube Configuration; 4.4.2. Specific Loading; 4.4.3. Care of the X-ray Tube; 4.5. Effective Line Width; 4.6. Spectral Contamination; 4.6.1. X-ray Tube Life; 4.7. The Rotating Anode X-ray Tube; References; CHAPTER 5. DETECTORS AND DETECTION ELECTRONICS; 5.1. X-ray Detectors; 5.2. Desired Properties of an X-ray Detector; 5.2.1. Quantum-Counting Efficiency; 5.2.2. Linearity; 5.2.3. Energy Proportionality; 5.2.4. Resolution; 5.3. Types of Detector; 5.3.1. The Gas Proportional Counter; 5.3.2. Position-Sensitive Detectors |
5.3.3. The Scintillation Detector |
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Sommario/riassunto |
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When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity.Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation o |
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