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Titolo |
The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council |
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