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1. |
Record Nr. |
UNINA9910136931003321 |
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Autore |
Hudak John (John Joseph) |
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Titolo |
The Medical Marijuana Mess [[electronic resource] ] : A Prescription for Fixing a Broken Policy / / John Hudak |
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Pubbl/distr/stampa |
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Washington, District of Columbia : , : Brookings Institution, , 2016 |
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©2016 |
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ISBN |
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Descrizione fisica |
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1 online resource (25 p.) |
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Collana |
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Disciplina |
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Soggetti |
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Marijuana - Law and legislation - United States |
Marijuana - Therapeutic use - Government policy - United States |
Electronic books. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di contenuto |
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An ancient and honorable medical tradition -- First do no harm -- Legal limbo -- The research gap -- The information gap -- Business limbo -- Comprehensive reforms in three areas. |
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Sommario/riassunto |
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The uncertainty and inconsistency surrounding federal and state laws for medical marijuana use, distribution, and research is placing unnecessary obstacles in the way of suffering patients, their families, and the people trying to help them. In The Medical Marijuana Mess, senior fellow John Hudak illustrates the extreme dysfunction of medical marijuana policy through two different narratives: the Collins', who make the painful choice to split up their family in order to treat their daughter's debilitating epilepsy with CBD oil, and Rabbi Jeffrey Kahn, a medical marijuana dispensary owner who encountered unimaginable obstacles, scrutiny, and personal liability in order to help other patients in need. |
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2. |
Record Nr. |
UNINA9911019779303321 |
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Titolo |
Methods II / / edited by S. Amelinckx ... [et al.] |
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Pubbl/distr/stampa |
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ISBN |
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9786611764654 |
9781281764652 |
1281764655 |
9783527620524 |
3527620524 |
9783527620531 |
3527620532 |
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Descrizione fisica |
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1 online resource (509 p.) |
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Collana |
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Handbook of microscopy : applications in materials science, solid-state physics, and chemistry ; ; [v. 2] |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Microscopy |
Materials - Microscopy |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes |
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z |
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Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons |
2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS |
2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects |
2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry |
2.5.1.12 Energy-Dispersive Spectrometry |
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Sommario/riassunto |
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Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.With the Handbook of Microscopy, scientists and engineers involved in m |
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