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Record Nr. |
UNINA9910133643903321 |
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Titolo |
X-rays in nanoscience : spectroscopy, spectromicroscopy, and scattering techniques / / edited by Jinghua Guo |
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Pubbl/distr/stampa |
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Weinheim, : Wiley-VCH |
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Chichester, : John Wiley [distributor], c2010 |
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ISBN |
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1-283-30240-3 |
9786613302403 |
3-527-63229-8 |
3-527-63228-X |
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Descrizione fisica |
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1 online resource (278 p.) |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Nanostructured materials |
X-ray microanalysis |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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X-Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques; Contents; Preface; List of Contributors; 1 Introduction; 2 High-Resolution Soft X-Ray Microscopy for Imaging Nanoscale Magnetic Structures and Their Spin Dynamics; 2.1 Introduction; 2.2 X-Ray Optics and Soft X-Ray Microscopy; 2.3 Magnetic Soft X-Ray Microscopy; 2.4 Static Nanoscale Magnetic Structures; 2.5 Spin Dynamics in Nanoscale Magnetic Structures; 2.6 Future Perspectives for Magnetic Soft X-Ray Microscopy; Acknowledgments; References |
3 Advances in Magnetization Dynamics Using Scanning Transmission X-Ray Microscopy3.1 Introduction; 3.2 Magnetism in Confined Structures; 3.2.1 Magnetic Thin Film Structures of Ideally Soft Materials; 3.2.2 Spin Dynamics of the Magnetic Vortex State; 3.3 Experimental Setup; 3.3.1 Zone Plate; 3.3.2 Radiation Damage and Choice of Detectors; 3.3.3 Time-Resolved Magnetic Imaging; 3.3.3.1 Contrast Mechanism for Magnetic Imaging; 3.3.3.2 Sample and Stripline Configuration for In-Plane Field Excitation; 3.3.3.3 Excitation Types; 3.3.3.4 Experimental Setup and Data Acquisition |
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3.4 Magnetic Characterization of Ferromagnetic Structures3.4.1 Spin-Reorientation Transition in Ferromagnetic Multilayers on Nanospheres; 3.4.2 Magnetic Characterization of Magnetic Vortex Structures; 3.4.2.1 In-Plane Magnetization of a Vortex Structure; 3.4.2.2 Out-of-Plane Magnetization of a Vortex Structure; 3.5 Magnetization Dynamics in Ferromagnetic Vortex Structures; 3.5.1 Differential Imaging of Magnetic Vortex Structures; 3.5.2 Gyrotropic Mode; 3.5.2.1 Resonant Behavior under Pulsed Excitation; 3.5.2.2 Resonant Sine Excitation; 3.5.3 Nonlinear Response of Magnetic Vortex Structures |
3.5.3.1 Vortex Core Reversal by Burst Excitation3.5.3.2 Vortex Core Reversal - Mechanism; 3.5.3.3 Final Remarks; 3.6 Conclusion and Outlook; Acknowledgments; References; 4 Scanning Photoelectron Microscopy for the Characterization of Novel Nanomaterials; 4.1 Introduction; 4.2 Photoelectron Spectroscopy; 4.3 Scanning Photoelectron Microscopy; 4.3.1 The Focusing Optics; 4.3.2 The Electron Energy Analyzer; 4.3.3 The Sample Scanning Mechanism; 4.4 The Application of Scanning Photoelectron Microscopy; 4.4.1 Oxidation States in Scanning-Probe-Induced Si3N4 to SiOx Conversion |
4.4.2 Well-Aligned Carbon Nanotubes4.4.3 GaN Nanowires; 4.4.4 Well-Aligned ZnO Nanorods; 4.4.5 Diameter Dependence of the Electronic Structure of ZnO Nanorods Determined by Scanning Photoelectron Microscopy; 4.4.6 Comparison of the Electronic Structures of Zn1-xCoxO and Zn1-xMgxO Nanorods; 4.5 Conclusion; Acknowledgments; References; 5 Coherent X-Ray Diffraction Microscopy; 5.1 Introduction; 5.1.1 A Brief History of the Phase Problem; 5.1.2 Scattering of X-Rays by Homogeneous Media; 5.1.2.1 The First Born Approximation; 5.1.3 The First Rytov Approximation |
5.1.4 Comparison of CXDM with other X-Ray Microscopes |
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Sommario/riassunto |
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An up-to-date overview of the different x-ray based methods in the hot fields of nanoscience and nanotechnology, including methods for imaging nanomaterials, as well as for probing the electronic structure of nanostructured materials in order to investigate their different properties. Written by authors at one of the world's top facilities working with these methods, this monograph presents and discusses techniques and applications in the fields of x-ray scattering, spectroscopy and microscope imaging. The resulting systematic collection of these advanced tools will benefit graduate studen |
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