1.

Record Nr.

UNINA9910480852603321

Autore

Finkin Jordan D. <1976->

Titolo

An inch or two of time : time and space in Jewish modernisms / / Jordan D. Finkin

Pubbl/distr/stampa

University Park, Pennsylvania : , : Pennsylvania State University Press, , [2015]

©2015

ISBN

0-271-07195-8

0-271-07197-4

Descrizione fisica

1 online resource (x, 249 pages )

Collana

Dimyonot: Jews and the Cultural Imagination ; ; Volume 3

Disciplina

892.41609

Soggetti

Space and time in literature

Yiddish poetry - 20th century - History and criticism

Modernism (Literature)

Jewish poetry - 20th century - History and criticism

Hebrew poetry, Modern - 20th century - History and criticism

Electronic books.

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph

Nota di bibliografia

Includes bibliographical references (pages 231-240) and index.

Nota di contenuto

Introduction : the aesthetics of spatiotemporality -- A brief essay on time, space, nation, and metaphor -- "Heymen un Reymen": homelandscapes, shtetlekh, and other creative spaces -- Temporaesthesia -- The revolutionary principles of time and space -- Enclosed in distances : the poetic experiments of Yocheved Bat-Miriam.

Sommario/riassunto

"Explores the metaphorical power of time and space in Jewish modernist poetry in Hebrew and Yiddish as a response to the experience of exile and landlessness, and as a means of furthering modernism's exploration of the self and its relation to community, nation, and the world"--Provided by publisher.



2.

Record Nr.

UNINA9910132357903321

Titolo

2013 22nd Asian Test Symposium : (ATS 2013) : Yilan, Taiwan, 18-21 November 2013 / / Asian Test Symposium (22nd : 2013 : I-lan hsien, Taiwan)

Pubbl/distr/stampa

Piscataway, NJ, : , : IEEE, , 2013

ISBN

0-7695-5080-0

Descrizione fisica

1 online resource (309 pages) : illustrations

Disciplina

621.3815

Soggetti

Electronic circuits - Testing

Electronic digital computers Circuits - Testing

Fault-tolerant computing

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia