1.

Record Nr.

UNINA990007837240403321

Autore

Thirion, Nicolas

Titolo

Les privatisations d'enterprises publiques dans une economie sociale de marche : aspects juridiques / Nicolas Thirion

Pubbl/distr/stampa

Bruxelles : Brylant

Paris : L.G.D.J., 2002

ISBN

2-8027-1591-7

Descrizione fisica

790 p. ; 24 cm

Locazione

DDCP

Collocazione

21-DA-101

Lingua di pubblicazione

Francese

Formato

Materiale a stampa

Livello bibliografico

Monografia

2.

Record Nr.

UNINA9910257443803321

Autore

Daillant Jean

Titolo

X-Ray and Neutron Reflectivity: Principles and Applications / / by Jean Daillant, Alain Gibaud

Pubbl/distr/stampa

Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1999

ISBN

3-540-48696-8

Edizione

[1st ed. 1999.]

Descrizione fisica

1 online resource (XXIII, 331 p.)

Collana

Lecture Notes in Physics Monographs ; ; 58

Disciplina

530.41

Soggetti

Condensed matter

Spectrum analysis

Surfaces (Technology)

Thin films

Particle accelerators

Condensed Matter Physics

Spectroscopy

Surfaces, Interfaces and Thin Film

Accelerator Physics

Lingua di pubblicazione

Inglese



Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

Principles -- The Interaction of X-rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity from Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- Applications -- Statistical Physics at Crystal Surfaces -- Experiments on Solid Surfaces -- X-ray Reflectivity by Rough Multilayers -- Reflectivity of Liquid Surfaces and Interfaces -- polymer Studies.

Sommario/riassunto

The book is the first comprehensive introduction to x-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next. The approximations are rigorously introduced and many experimental effects are discussed. In the case of neutron reflectivity, particular attention is paid to the reflectivity of polarized neutrons from magnetic multilayers, which allows the determination of in-plane magnetization profiles. Many applications are reviewed in the second part: rough surfaces, interfaces and multilayers, liquid surfaces and soft-condensed matter, and thin polymer films. In each case the underlying physics is first introduced, then specific experimental methods are described. The book addresses researchers and graduate students.