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1. |
Record Nr. |
UNINA990003686030403321 |
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Autore |
Luzzatti Luigi E il Suo tempo |
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Titolo |
Atti del Convegno internazionale di studio (Venezia , 7-9 Novembre 1991) / raccolti da Pier Luigi Ballini e Paolo Pecorari |
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Pubbl/distr/stampa |
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Venezia : Istituto Veneto di Scienze Lettere ed Arti, 1994 |
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ISBN |
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Descrizione fisica |
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Collana |
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Biblioteca Luzzattiana : Fonti e studi ; 2 |
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Locazione |
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Collocazione |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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2. |
Record Nr. |
UNINA9910953325703321 |
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Autore |
Moreira Jose <1975-> |
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Titolo |
An engineer's guide to automated testing of high-speed interfaces / / Jose Moreira, Hubert Werkmann |
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Pubbl/distr/stampa |
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Boston, : Artech House, c2010 |
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ISBN |
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Edizione |
[1st ed.] |
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Descrizione fisica |
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1 online resource (590 p.) |
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Collana |
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Artech House microwave library |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Very high speed integrated circuits |
Automatic test equipment |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed |
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Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC |
E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index |
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Sommario/riassunto |
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Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches. |
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