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Record Nr. |
UNICAMPANIAVAN00275696 |
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Titolo |
Advanced mathematical and computational tools in metrology and testing X / edited by F. Pavese ... [et al.] |
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Pubbl/distr/stampa |
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Singapore, : World scientific, 2015 |
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ISBN |
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Descrizione fisica |
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xi, 429 p. : ill. ; 24 cm |
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Soggetti |
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62-XX - Statistics [MSC 2020] |
62P30 - Applications of statistics in engineering and industry; control charts [MSC 2020] |
68Uxx - Computing methodologies and applications [MSC 2020] |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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